The Logic Mapper

1998 ◽  
Author(s):  
Shawn Smith
Keyword(s):  
Failure Analysis ◽  
Functional Test ◽  
Yield Enhancement ◽  
Wafer Fab ◽  
Starting Point ◽  
Product Engineering ◽  
Device Integration ◽  
Large Populations ◽  
Test Correlation

Abstract The Logic Mapper software created by Knights Technology bridges the gap between traditional yield enhancement techniques in the wafer fab and analytical failure techniques in the failure analysis (FA) laboratory. With Logic Mapper, fabs can test logic devices as easily as memory devices. Traditional logic chip yield enhancement techniques within product engineering and wafer fab yield enhancement organizations rely heavily on binsort functional test correlation to anticipate and correct semiconductor process issues. Some of the key shortcomings of these techniques are: · The inability to relate a particular bin’s fallout to a suspect process level. · The inability to distinguish a defect-driven yield issue from a device-integration issue. · The inability to establish a clear link between large populations of failed die. Logic Mapper resolves these key shortcomings by taking the output from functional testers and translating it from a list of failed scan chains into a list of suspected netlist nodes. Using Merlin’s FrameworkTM software, the netlist can be used to identify the X, Y coordinates of a suspected failing node; the failure analysis and yield enhancement engineers have created a starting point for investigating failures. These nodes can then be crossmapped from the circuit design onto the chip’s layout over multiple photomask layers within the design. The ability to translate a logic device’s binsort functional test fail data to defect traces is an advancement in the quality of test information provided for failure analysis and yield enhancement.

ATE Failure Isolation Methodologies for Failure Analysis, Design Debug and Yield Enhancement

1998 ◽  
Author(s):  
D.S. Patrick ◽  
L.C. Wagner ◽  
P.T. Nguyen
Keyword(s):  
Integrated Circuits ◽  
Failure Analysis ◽  
Yield Enhancement ◽  
Production Test ◽  
Final Test ◽  
Critical Design ◽  
The Past ◽  
Product Engineering ◽  
Time Savings ◽  
Analysis Design

Abstract Failure isolation and debug of CMOS integrated circuits over the past several years has become increasingly difficult to perform on standard failure analysis functional testers. Due to the increase in pin counts, clock speeds, increased complexity and the large number of power supply pins on current ICS, smaller and less equipped testers are often unable to test these newer devices. To reduce the time of analysis and improve the failure isolation capabilities for failing ICS, failure isolation is now performed using the same production testers used in product development, multiprobe and final test. With these production testers, the test hardware, program and pattern sets are already available and ready for use. By using a special interface that docks the production test head to failure isolation equipment such as the emission microscope, liquid crystal station and E-Beam prober, the analyst can quickly and easily isolate the faillure on an IC. This also enables engineers in design, product engineering and the waferfab yield enhancement groups to utilize this equipment to quickly solve critical design and yield issues. Significant cycle time savings have been achieved with the migration to this method of electrical stimulation for failure isolation.

Case Study in Fault Isolation of a Metal Short for Yield Enhancement

2010 ◽  
Author(s):  
Sarven Ipek ◽  
David Grosjean
Keyword(s):  
Failure Analysis ◽  
Failure Mechanism ◽  
Photon Emission ◽  
Fault Isolation ◽  
Yield Enhancement ◽  
Analysis Technique ◽  
Laser Signal ◽  
Signal Injection ◽  
Microscopy Techniques

Abstract The application of an individual failure analysis technique rarely provides the failure mechanism. More typically, the results of numerous techniques need to be combined and considered to locate and verify the correct failure mechanism. This paper describes a particular case in which different microscopy techniques (photon emission, laser signal injection, and current imaging) gave clues to the problem, which then needed to be combined with manual probing and a thorough understanding of the circuit to locate the defect. By combining probing of that circuit block with the mapping and emission results, the authors were able to understand the photon emission spots and the laser signal injection microscopy (LSIM) signatures to be effects of the defect. It also helped them narrow down the search for the defect so that LSIM on a small part of the circuit could lead to the actual defect.

Failure Analysis of Killer Defects and Yield Enhancement of Flat ROM Devices in Wafer Fabrication

2000 ◽  
Author(s):  
Y. N. Hua ◽  
Z. R. Guo ◽  
L. H. An ◽  
Shailesh Redkar
Keyword(s):  
Electron Microscope ◽  
Failure Analysis ◽  
Fault Isolation ◽  
Yield Enhancement ◽  
Wafer Fabrication ◽  
X Ray ◽  
Particle Contamination ◽  
Emission Microscopy ◽  
Microscopy Techniques ◽  
Scanning Electron

Abstract In this paper, some low yield cases in Flat ROM device (0.45 and 0.6 µm) were investigated. To find killer defects and particle contamination, KLA, bitmap and emission microscopy techniques were used in fault isolation. Reactive ion etching (RIE) and chemical delayering, 155 Wright Etch, BN+ Etch and scanning electron microscope (SEM) were used for identification and inspection of defects. In addition, energy-dispersive X-ray microanalysis (EDX) was used to determine the composition of the particle or contamination. During failure analysis, seven kinds of killer defects and three killer particles were found in Flat ROM devices. The possible root causes, mechanisms and elimination solutions of these killer defects/particles were also discussed.

A Sample Preparation on Decapsulation Methodology for Effective Failure Analysis on Thin Small Leadless (TSLP) Flip Chip Package with Copper Pillar (CuP) Bump Interconnect Technology

2014 ◽  
Author(s):  
Gwee Hoon Yen ◽  
Ng Kiong Kay
Keyword(s):  
Sample Preparation ◽  
Failure Analysis ◽  
Flip Chip ◽  
Fault Localization ◽  
Cost Effective ◽  
Fault Isolation ◽  
Voltage Contrast ◽  
Interconnect Technology

Abstract Today, failure analysis involving flip chip [1] with copper pillar bump packaging technologies would be the major challenges faced by analysts. Most often, handling on the chips after destructive chemical decapsulation is extremely critical as there are several failure analysis steps to be continued such as chip level fault localization, chip micro probing for fault isolation, parallel lapping [2, 3, 4] and passive voltage contrast. Therefore, quality of sample preparation is critical. This paper discussed and demonstrated a quick, reliable and cost effective methodology to decapsulate the thin small leadless (TSLP) flip chip package with copper pillar (CuP) bump interconnect technology.

Advanced Scan Diagnosis Based Fault Isolation and Defect Identification for Yield Learning

2005 ◽  
Author(s):  
Chris Eddleman ◽  
Nagesh Tamarapalli ◽  
Wu-Tung Cheng
Keyword(s):  
Failure Analysis ◽  
Fault Location ◽  
Effective Means ◽  
Fault Isolation ◽  
Yield Enhancement ◽  
Yield Analysis ◽  
Isolation Techniques ◽  
Yield Learning ◽  
Time Required ◽  
Inspection Data

Abstract Yield analysis of sub-micron devices is an ever-increasing challenge. The difficulty is compounded by the lack of in-line inspection data as many companies adopt foundry or fab-less models for acquiring wafers. In this scenario, failure analysis is increasingly critical to help drive yields. Failure analysis is a process of fault isolation, or a method of isolating failures as precisely as possible followed by identification of a physical defect. As the number of transistors and metal layers increase, traditional fault isolation techniques are less successful at isolating a cause of failures. Costs are increasing due to the amount of time needed to locate the physical defect. One solution to the yield analysis problem is scan diagnosis based fault isolation. Previous scan diagnosis based techniques were limited with little information about the type of fault and confidence of diagnosis. With new scan diagnosis algorithms it is now possible to not only isolate, but to identify the type of fault as well as assigning a confidence ranking prior to any destructive analysis. This paper presents multiple case studies illustrating the application of scan diagnosis as an effective means to achieve yield enhancement. The advanced scan diagnostic tool used in this study provides information about the fault type as well as fault location. This information focuses failure analysis efforts toward a suspected defect, decreasing the cycle time required to determine root cause, as well as increasing the over all success rate.

Application of membrane technology in the pretreatment of cheese dairies wastes and co-treatment in a municipal conventional biological unit

1997 ◽  
Vol 36 (2-3) ◽  
pp. 361-367 ◽  
Author(s):  
Eleftheria Papachristou ◽  
Costas T. Lafazanis
Keyword(s):  
Cheese Whey ◽  
Treatment Plant ◽  
Membrane Technology ◽  
Biological Unit ◽  
Urban Sewage ◽  
Dairy Wastes ◽  
Starting Point ◽  
Quality Of Milk ◽  
Cheese Production

A great number of cheese dairies and dairy industries in Greece are disposing their wastes, mainly cheese whey, either on land or in surface receivers, in large quantities creating a major environmental problem. A typical agricultural and pastoral provincial town of 70,000 inhabitants, Trikala, became the starting point of this research. A co-treatment of the urban sewage and the dairy wastes in the municipal treatment plant was recommended. The successful application of the above statement is based primarily on the pretreatment of the cheese dairies wastes. So far for cheese whey the recovery of the lactose serum in the contemporary central unit applying membrane technology has been suggested. As far as the wastewaters of the washing and refrigeration are concerned a pretreatment is required for the defatting in a grease trap, the grating, the adjustment of pH and the equalisation in an appropriate tank. Finally, this research has also focussed on the importance of membrane technology in improving the quality of milk and cheese production.

PENERAPAN PEMBELAJARAN METODE DISKUSI UNTUK MENINGKATKAN AKTIVITAS BELAJAR SISWA PADA PEMBELAJARAN IPS TERPADU DI KELAS VIII.B SMP NEGERI 5 KOTA SOLOK

2019 ◽  
Vol 5 (1) ◽  
pp. 35-42
Author(s):  
Erma Yenis
Keyword(s):  
Student Learning ◽  
Learning Outcomes ◽  
Learning Process ◽  
Teaching And Learning ◽  
Student Learning Outcomes ◽  
Learning Activities ◽  
Good Teaching ◽  
Starting Point ◽  
Class Viii

Abstractlearning process  good teaching  can create a situation that allows children to learn, so that is the starting point of the success of teaching. The low quality of education depends on the management of the teaching and learning process which can be interpreted as being less effective in the teaching and learning process, the causes: (1) Low learning activities, (2) Inadequate facilities and infrastructure. The case in Solok City Middle School, the low level of student learning activities allegedly influenced the low student learning outcomes. Based on observations on class VIII A which included the superior class had not yet achieved the desired completeness, the class with the least completeness was class VIII B which was 33.33% with KKM 65 criteria. Seeing this reality, teachers were required to motivate students and foster enthusiasm student learning. Therefore, to foster students' enthusiasm for learning, the author tries to apply student learning activities through discussion methods in small groups.Keywords: Learning, discussion AbstrakProses belajar mengajar yang baik dapat menciptakan situasi yang mmemungkinkan anak belajar, sehingga merupakan titik awal keberhasilan pengajaran. Rendahnya mutu pendidikan tergantung pada pengelolaan proses belajar mengajar yang dapat diartikan kurang efektifnya proses belajar mengajar, penyebabnya: (1) Rendahnya aktifitas belajar,  (2) Sarana dan prasarana yang belum memadai. Kasus pada SMP Negeri % Kota Solok rendahnya aktifitas belajar siswa diduga berpengaruh terhadap rendahnya hasil belajar siswa. Berdasarkan pengamatanpada  kelas VIII A yang termasuk kelas unggul belum mencapai ketuntasan yang di inginkan, sedangkan kelas yang paling sedikit ketuntasannya adalah kelas VIII B yaitu sebanyak 33,33 % dengan kriterian KKM 65. Melihat kenyataan tersebut, guru dituntut untuk dapat memotivasi siswa dan menumbuhkan semangat belajar siswa. Karena itu, untuk menumbuhkan semangat belajar siswa, penulis mencoba untuk menerapkan aktivitas belajar siswa melalui metode diskusi dalam kelompok kecil. Kata kunci: Pembelajaran, diskusi

scholarly journals DEEPER COMPREHENSION OF BASIC ENVIRONMENTAL ISSUES THROUGH SERIOUS GAME

2021 ◽  
Vol 1 ◽  
pp. 881-890
Author(s):  
Michal Kozderka ◽  
Bertrand Rose
Keyword(s):  
Decision Making ◽  
Failure Analysis ◽  
Education Program ◽  
Environmental Issues ◽  
Environmental Problems ◽  
Serious Game ◽  
Financial Loss ◽  
Starting Point ◽  
Basic Comprehension

AbstractDuring the last three decades we observe growing use of ecodesign, but we observe also misuse of ecodesign methods, leading often to time and financial loss. In coherence with several failure analysis and with our observation, we base our work on a hypothesis: Misuse of ecodesign is often caused by lack of basic comprehension of environmental issues: Non linearity of the processes, their inertia and their excessive costs.Building on this hypothesis, we decided to enhance our education program with an innovative serious game. The goal is to achieve comprehension of the basic environmental issues. Innovation of the game lies in revealing to students at the end of the game, that the fictive initial situation of the game corresponded to a starting point of a real catastrophe. Students can thus not only compare their decisions with those of real leaders, but also to understand how and why bad decisions were taken.Experiments indicate that students who played the game tend to evaluate environmental problems, while those who followed a lecture tend to describe them. This trend (going further than to a description) seems to be useful in decision making and in deployment of ecodesign methods.

scholarly journals How can electric lighting contribute to human health and well-being?

2021 ◽  
Vol 53 (5) ◽  
pp. 515-522
Author(s):  
P Raynham
Keyword(s):  
Human Health ◽  
Psychological Impact ◽  
Health Benefits ◽  
Well Being ◽  
Health Problems ◽  
Starting Point ◽  
Electric Light ◽  
Health And Well Being ◽  
Hypothetical Explanation

Electric light in buildings may provide some health benefits; however, for most people these benefits are likely to be small. It is possible for electric lighting to cause health problems, if there is too little light or there is glare, but for the most part there is good guidance available and these problems can be avoided. The quality of the lit environment can have a psychological impact and this may in turn impact well-being. A starting point for this is perceived adequacy of illumination. Related lighting metrics are examined and a hypothetical explanation is suggested.

scholarly journals Thermal Physics and Glaucoma II: Preliminary Evidences for a Thermophysical Design of a Possible Visible-Light-Photons Therapy

2021 ◽  
Vol 11 (14) ◽  
pp. 6301
Author(s):  
Giulia Grisolia ◽  
Mariarosa Astori ◽  
Antonio Ponzetto ◽  
Antonio Vercesi ◽  
Umberto Lucia
Keyword(s):  
Quality Of Life ◽  
Thermodynamic Approach ◽  
Equilibrium Thermodynamic ◽  
Pharmacological Treatments ◽  
Light Stimulation ◽  
Cell Behaviour ◽  
Thermal Physics ◽  
Starting Point

Recently, a non-equilibrium thermodynamic approach has been developed in order to model the fundamental role of the membrane electric potential in the cell behaviour. A related new viewpoint is introduced, with a design of a photobiomodulation treatment in order to restore part of the visual field. Here, a first step in experimental evidence of the validity of the thermodynamic approach is developed. This result represents the starting point for future experimental improvements for light stimulation in order to improve the quality of life of the patients. The future possible therapy will be in addition to the pharmacological treatments.

Sign in / Sign up

Export Citation Format

Share Document