scholarly journals A New Generation of Neutrino Cross Section Experiments: Challenges and Opportunities

Symmetry ◽  
2021 ◽  
Vol 13 (9) ◽  
pp. 1625
Author(s):  
Antonio Branca ◽  
Giulia Brunetti ◽  
Andrea Longhin ◽  
Marco Martini ◽  
Fabio Pupilli ◽  
...  
Keyword(s):  
Cross Section ◽  
Cross Sections ◽  
Symmetry Violation ◽  
Theoretical Understanding ◽  
Leptonic Sector ◽  
Challenges And Opportunities ◽  
Neutrino Cross Section ◽  
Cp Symmetry ◽  
New Generation ◽  
O 10

Our knowledge of neutrino cross sections at the GeV scale, instrumental to test CP symmetry violation in the leptonic sector, has grown substantially in the last two decades. Still, their precision and understanding are far from the standard needed in contemporary neutrino physics. Nowadays, the knowledge of the neutrino cross section at O(10%) causes the main systematic uncertainty in oscillation experiments and jeopardizes their physics reach. In this paper, we envision the opportunities for a new generation of cross section experiments to be run in parallel with DUNE and HyperKamiokande. We identify the most prominent physics goals by looking at the theory and experimental limitations of the previous generation of experiments. We highlight the priorities in the theoretical understanding of GeV cross sections and the experimental challenges of this new generation of facilities.

POLARIZED AND UNPOLARIZED INCLUSIVE ELECTRON SCATTERING IN NUCLEI AND THE INCLUSIVE NEUTRINO CROSS-SECTION

1995 ◽  
Vol 04 (01) ◽  
pp. 163-179
Author(s):  
S.L. MINTZ ◽  
M. POURKAVIANI
Keyword(s):  
Cross Section ◽  
Electron Scattering ◽  
Cross Sections ◽  
Inelastic Electron ◽  
Nuclear Excitation ◽  
Scattering Cross ◽  
Neutrino Cross Section ◽  
Inclusive Electron ◽  
Scattering Cross Sections ◽  
The Relationship

The unpolarized and parity violating polarized inclusive inelastic electron scattering cross-sections are calculated for incident electrons from threshold to 100 MeV, for the 12C nucleus. The relationship between these cross-sections and the inclusive neutrino cross-section on this same nucleus is discussed. The possibility of using the parity violating polarized electron scattering interaction to obtain the average nuclear excitation is also discussed.

scholarly journals Fission program at n_TOF

2019 ◽  
Vol 211 ◽  
pp. 03006 ◽  
Author(s):  
L. Tassan-Got ◽  
N. Colonna ◽  
M. Diakaki ◽  
Z. Eleme ◽  
A. Manna ◽  
...  
Keyword(s):  
Cross Section ◽  
Cross Sections ◽  
Fission Fragment ◽  
Angular Distributions ◽  
Neutron Absorption ◽  
Fission Fragments ◽  
Advanced Fuels ◽  
Thermal Region ◽  
Energy Domain ◽  
New Generation

Since its start in 2001 the n_TOF collaboration developed a measurement program on fission, in view of advanced fuels in new generation reactors. A special effort was made on measurement of cross sections of actinides, exploiting the peculiarity of the n_TOF neutron beam which spans a huge energy domain, from the thermal region up to GeV. Moreover fission fragment angular distributions have also been measured. An overview of the cross section results achieved with different detectors is presented, including a discussion of the 237Np case where discrepancies showed up between different detector systems. The results on the anisotropy of the fission fragments and its implication on the mechanism of neutron absorption, and in applications, are also shown.

scholarly journals Measurement of the 234U(n,f) cross section in the energy range between 14.8 and 17.8 MeV using Micromegas detectors

2020 ◽  
Vol 27 ◽  
pp. 25
Author(s):  
Antigoni Kalamara ◽  
S. Chasapogloou ◽  
V. Michalopoulou ◽  
A. Stamatopoulos ◽  
Z. Eleme ◽  
...  
Keyword(s):  
Energy Range ◽  
Cross Section ◽  
Cross Sections ◽  
Volume Fraction ◽  
Tandem Accelerator ◽  
Driven Systems ◽  
Accelerator Driven Systems ◽  
New Generation ◽  
Actinide Targets ◽  
Fission Yields

Neutron induced fission cross sections of actinides present special interest, since they lead to the design optimization of new generation reactors (Generation IV) as well as Accelerator Driven Systems (ADS). In the present work, the 234U(n,f) cross section was measured for which only a few available discrepant data exist in literature leading to poor evaluations. More specifically, four irradiations were performed at the 5.5 MV Tandem Accelerator Laboratory of NCSR “Demokritos” using quasi-monoenergetic neutrons produced by the 3H(d,n)4He reaction in the 14.8-19.2 MeV energy range. The 234U(n,f) cross section was measured relatively to the 235U(n,f) and 238U(n,f) reference ones and in order to perform the in-beam measurements for each of the actinide targets (234U, 238U, 235U), a Micromegas detector was used to record the fission fragments. The target-detector pairs were placed in an Al chamber filled with a Ar:CO2 (in 80:20 volume fraction) gas mixture at atmospheric pressure and temperature. The efficiency of the Micromegas detectors was estimated by Monte-Carlo simulations using the GEF and FLUKA codes. In addition, a detailed study of the neutron energy spectra was carried out by coupling both NeuSDesc and MCNP5 codes in order to take into account and correct for the contribution of low energy parasitic neutrons in the fission yields.

Electron Irradiation Effects in Polyoxymethylene Crystals Grown Inside Trioxane Crystals

1971 ◽  
Vol 29 ◽  
pp. 78-79
Author(s):  
J. P. Colson ◽  
D. H. Reneker
Keyword(s):  
Cross Section ◽  
Cross Sections ◽  
Detailed Examination ◽  
The Other ◽  
Electron Micrograph ◽  
Irradiation Effects ◽  
Threefold Axis ◽  
Typical Sample ◽  
Polymer Crystals ◽  
Chain Axis

Polyoxymethylene (POM) crystals grow inside trioxane crystals which have been irradiated and heated to a temperature slightly below their melting point. Figure 1 shows a low magnification electron micrograph of a group of such POM crystals. Detailed examination at higher magnification showed that three distinct types of POM crystals grew in a typical sample. The three types of POM crystals were distinguished by the direction that the polymer chain axis in each crystal made with respect to the threefold axis of the trioxane crystal. These polyoxymethylene crystals were described previously.At low magnifications the three types of polymer crystals appeared as slender rods. One type had a hexagonal cross section and the other two types had rectangular cross sections, that is, they were ribbonlike.

A quantitative approach to inner shell losses

1978 ◽  
Vol 36 (1) ◽  
pp. 526-527 ◽  
Author(s):  
R.D. Leapman ◽  
P. Rez ◽  
D.F. Mayers
Keyword(s):  
Energy Transfer ◽  
Cross Section ◽  
Cross Sections ◽  
Accurate Determination ◽  
Background Intensity ◽  
Core Excitation ◽  
Quantitative Basis ◽  
Cross Section Differential ◽  
Bound Electrons

Microanalysis by EELS has been developing rapidly and though the general form of the spectrum is now understood there is a need to put the technique on a more quantitative basis (1,2). Certain aspects important for microanalysis include: (i) accurate determination of the partial cross sections, σx(α,ΔE) for core excitation when scattering lies inside collection angle a and energy range ΔE above the edge, (ii) behavior of the background intensity due to excitation of less strongly bound electrons, necessary for extrapolation beneath the signal of interest, (iii) departures from the simple hydrogenic K-edge seen in L and M losses, effecting σx and complicating microanalysis. Such problems might be approached empirically but here we describe how computation can elucidate the spectrum shape.The inelastic cross section differential with respect to energy transfer E and momentum transfer q for electrons of energy E0 and velocity v can be written as

Oxygen K near edge structures studied with multiple scattering calculations

1988 ◽  
Vol 46 ◽  
pp. 504-505
Author(s):  
Xudong Weng ◽  
Peter Rez
Keyword(s):  
Cross Section ◽  
Cross Sections ◽  
Partial Cross Section ◽  
Energy Window ◽  
Edge Structure ◽  
Fine Structures ◽  
Hydrogenic Model ◽  
Electron Energy Loss ◽  
Quantitative Chemical

In electron energy loss spectroscopy, quantitative chemical microanalysis is performed by comparison of the intensity under a specific inner shell edge with the corresponding partial cross section. There are two commonly used models for calculations of atomic partial cross sections, the hydrogenic model and the Hartree-Slater model. Partial cross sections could also be measured from standards of known compositions. These partial cross sections are complicated by variations in the edge shapes, such as the near edge structure (ELNES) and extended fine structures (ELEXFS). The role of these solid state effects in the partial cross sections, and the transferability of the partial cross sections from material to material, has yet to be fully explored. In this work, we consider the oxygen K edge in several oxides as oxygen is present in many materials. Since the energy window of interest is in the range of 20-100 eV, we limit ourselves to the near edge structures.

Absolute inner-shell cross section determination for EELS analysis

1988 ◽  
Vol 46 ◽  
pp. 534-535
Author(s):  
P.A. Crozier
Keyword(s):  
Cross Section ◽  
Cross Sections ◽  
Absolute Cross Section ◽  
Specimen Thickness ◽  
Mass Thickness ◽  
Scattering Cross ◽  
Before And After ◽  
Estimated Error ◽  
Scattering Cross Sections ◽  
Electron Microscopist

Absolute inelastic scattering cross sections or mean free paths are often used in EELS analysis for determining elemental concentrations and specimen thickness. In most instances, theoretical values must be used because there have been few attempts to determine experimental scattering cross sections from solids under the conditions of interest to electron microscopist. In addition to providing data for spectral quantitation, absolute cross section measurements yields useful information on many of the approximations which are frequently involved in EELS analysis procedures. In this paper, experimental cross sections are presented for some inner-shell edges of Al, Cu, Ag and Au.Uniform thin films of the previously mentioned materials were prepared by vacuum evaporation onto microscope cover slips. The cover slips were weighed before and after evaporation to determine the mass thickness of the films. The estimated error in this method of determining mass thickness was ±7 x 107g/cm2. The films were floated off in water and mounted on Cu grids.

A technique for preparing semiconductor cross sections for both TEM and SEM analysis

1989 ◽  
Vol 47 ◽  
pp. 712-713
Author(s):  
Stanley J. Klepeis ◽  
J.P. Benedict ◽  
R.M Anderson
Keyword(s):  
Sample Preparation ◽  
Cross Section ◽  
Cross Sections ◽  
Sem Analysis ◽  
Preparation Technique ◽  
Ion Milling ◽  
Tem Analysis ◽  
Polished Cross Section ◽  
Area Of Interest ◽  
Polished Side

The ability to prepare a cross-section of a specific semiconductor structure for both SEM and TEM analysis is vital in characterizing the smaller, more complex devices that are now being designed and manufactured. In the past, a unique sample was prepared for either SEM or TEM analysis of a structure. In choosing to do SEM, valuable and unique information was lost to TEM analysis. An alternative, the SEM examination of thinned TEM samples, was frequently made difficult by topographical artifacts introduced by mechanical polishing and lengthy ion-milling. Thus, the need to produce a TEM sample from a unique,cross-sectioned SEM sample has produced this sample preparation technique.The technique is divided into an SEM and a TEM sample preparation phase. The first four steps in the SEM phase: bulk reduction, cleaning, gluing and trimming produces a reinforced sample with the area of interest in the center of the sample. This sample is then mounted on a special SEM stud. The stud is inserted into an L-shaped holder and this holder is attached to the Klepeis polisher (see figs. 1 and 2). An SEM cross-section of the sample is then prepared by mechanically polishing the sample to the area of interest using the Klepeis polisher. The polished cross-section is cleaned and the SEM stud with the attached sample, is removed from the L-shaped holder. The stud is then inserted into the ion-miller and the sample is briefly milled (less than 2 minutes) on the polished side. The sample on the stud may then be carbon coated and placed in the SEM for analysis.

Experimental Studies Of Multilayer Glass Structures On Compression, Compression With Bending And Simple Bending

2019 ◽  
pp. 22-30
Keyword(s):  
Cross Section ◽  
Cross Sections ◽  
Applied Load ◽  
Experimental Studies ◽  
Strength Properties ◽  
Research Topic ◽  
Normative Values ◽  
Laminated Glass ◽  
The Cross ◽  
Experimental Values

The work of multilayer glass structures for central and eccentric compression and bending are considered. The substantiation of the chosen research topic is made. The description and features of laminated glass for the structures investigated, their characteristics are presented. The analysis of the results obtained when testing for compression, compression with bending, simple bending of models of columns, beams, samples of laminated glass was made. Overview of the types and nature of destruction of the models are presented, diagrams of material operation are constructed, average values of the resistance of the cross-sections of samples are obtained, the table of destructive loads is generated. The need for development of a set of rules and guidelines for the design of glass structures, including laminated glass, for bearing elements, as well as standards for testing, rules for assessing the strength, stiffness, crack resistance and methods for determining the strength of control samples is emphasized. It is established that the strength properties of glass depend on the type of applied load and vary widely, and significantly lower than the corresponding normative values of the strength of heat-strengthened glass. The effect of the connecting polymeric material and manufacturing technology of laminated glass on the strength of the structure is also shown. The experimental values of the elastic modulus are different in different directions of the cross section and in the direction perpendicular to the glass layers are two times less than along the glass layers.

Cross Section Analysis of Cu Filled TSVs Based on High Throughput Plasma-FIB Milling

2012 ◽  
Author(s):  
Frank Altmann ◽  
Jens Beyersdorfer ◽  
Jan Schischka ◽  
Michael Krause ◽  
German Franz ◽  
...  
Keyword(s):  
High Resolution ◽  
Cross Section ◽  
High Throughput ◽  
Cross Sections ◽  
Electron Backscatter Diffraction ◽  
Grain Structure ◽  
Electron Backscatter ◽  
Section Surface ◽  
Backscatter Diffraction ◽  
Section Analysis

Abstract In this paper the new Vion™ Plasma-FIB system, developed by FEI, is evaluated for cross sectioning of Cu filled Through Silicon Via (TSV) interconnects. The aim of the study presented in this paper is to evaluate and optimise different Plasma-FIB (P-FIB) milling strategies in terms of performance and cross section surface quality. The sufficient preservation of microstructures within cross sections is crucial for subsequent Electron Backscatter Diffraction (EBSD) grain structure analyses and a high resolution interface characterisation by TEM.

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