Fabrication of Ni Sulfides by Thermal Sulfidation

2006 ◽  
Vol 510-511 ◽  
pp. 318-321
Author(s):  
Tae Hyun Nam ◽  
Cheol Am Yu ◽  
Dae Won Jung ◽  
Kwon Koo Cho
Keyword(s):  
Annealing Time ◽  
Annealing Temperature ◽  
Early Stage ◽  
Spherical Particles ◽  
Sulfur Pressure ◽  
X Ray ◽  
Ni Substrate ◽  
Initial Stage ◽  
Fabrication Parameters ◽  
Scanning Electron

The microstructure of Ni sulfides prepared by thermal sulfidation of pure Ni and their dependence of fabrication parameters were investigated by means of scanning electron microscopy and X-ray diffractions. Sulfidation was made by isothermally annealing Ni with the sulfur in vacuum sealed glass ampoules at 673 K for 120 – 600s under the sulfur pressure of 100 and 220 kPa. The sulfide layers formed in the early stage were found to consist of spherical particles smaller than 0.5um, which were grown and agglomerated with increasing annealing temperature. Thickness of sulfides developed on Ni substrate was found to increase with increasing annealing time and sulfur pressure. It was also found that compositions of dominant Ni sulfides changed with varying annealing time. At the initial stage, only Ni3S2 sulfide was formed on pure Ni, which was tightly bonded to Ni substrate. On increasing annealing time, NiS sulfide was formed. On further increasing annealing time, NiS1.97 sulfide was formed, which always coexisted with NiS sulfide. A mechanism for sulfidation of Ni is proposed as follows: 3Ni + 2S Ni3S2, Ni3S2 +S NiS, NiS + S NiS1.97

Preparation and Stabilization of High Conductivity Zn-Coated Tetra-Needle-Like ZnO Whiskers

2011 ◽  
Vol 197-198 ◽  
pp. 362-366
Author(s):  
Zhi Mei Xia ◽  
Cui Feng Wan ◽  
Sheng Ming Jin ◽  
Mo Tang Tang
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Zinc Oxide ◽  
Annealing Time ◽  
Electrical Resistance ◽  
Annealing Temperature ◽  
Electrical Resistance Measurement ◽  
X Ray Diffraction ◽  
X Ray ◽  
Scanning Electron

Tetra-needle-like zinc oxide whiskers (T-ZnOW) were coated with Zn and stabilized with Al2O3consequently. Coating conditions for preparation of low resistivity T-ZnOW were investigated. The Zn-coated T-ZnOW was characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM) and electrical resistance measurement. The SEM and XRD results indicated that the tetra-needle-like structure of ZnO whiskers could be well maintained after coating with Zn and stabilizing with Al2O3. Experiment results showed that the resistivity of T-ZnOW was affected significantly by the annealing temperature, annealing time, coating amount of Zn and original content of Al3+. Al3+ions played an important role in stabilizing the resistivity of Zn-coated T-ZnOW. The resistivity of T-ZnOW decreased considerably from 108to 101Ω•cm when the Zn-coated amount and Al3+original content were 10.0 wt.% and 2.0 at.%, respectively.Introduction.

scholarly journals A Study on the Characteristics of Cu–Mn–Dy Alloy Resistive Thin Films

Coatings ◽  
2019 ◽  
Vol 9 (2) ◽  
pp. 118 ◽  
Author(s):  
Ho-Yun Lee ◽  
Chi-Wei He ◽  
Ying-Chieh Lee ◽  
Da-Chuan Wu
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Annealing Temperature ◽  
Phase Evolution ◽  
Amorphous Structure ◽  
X Ray Diffraction ◽  
Temperature Coefficient Of Resistance ◽  
X Ray ◽  
Transmission Electronmicroscopy ◽  
Scanning Electron

Cu–Mn–Dy resistive thin films were prepared on glass and Al2O3 substrates, which wasachieved by co-sputtering the Cu–Mn alloy and dysprosium targets. The effects of the addition ofdysprosium on the electrical properties and microstructures of annealed Cu–Mn alloy films wereinvestigated. The composition, microstructural and phase evolution of Cu–Mn–Dy films werecharacterized using field emission scanning electron microscopy, transmission electronmicroscopy and X-ray diffraction. All Cu–Mn–Dy films showed an amorphous structure when theannealing temperature was set at 300 °C. After the annealing temperature was increased to 350 °C,the MnO and Cu phases had a significant presence in the Cu–Mn films. However, no MnO phaseswere observed in Cu–Mn–Dy films at 350 °C. Even Cu–Mn–Dy films annealed at 450 °C showedno MnO phases. This is because Dy addition can suppress MnO formation. Cu–Mn alloy filmswith 40% dysprosium addition that were annealed at 300 °C exhibited a higher resistivity of ∼2100 μΩ·cm with a temperature coefficient of resistance of –85 ppm/°C.

Electrochemical Synthesis and Photocatalytic Activity of Differently Shaped CuOx Particles

2017 ◽  
Vol 13 ◽  
pp. 330-333
Author(s):  
Anna Ulyankina ◽  
Igor Leontyev ◽  
Nina Smirnova
Keyword(s):  
Electron Microscopy ◽  
Photocatalytic Activity ◽  
Electrochemical Method ◽  
Spherical Particles ◽  
Photocatalytic Efficiency ◽  
X Ray Diffraction ◽  
X Ray ◽  
Polyhedral Particles ◽  
Copper Electrodes ◽  
Scanning Electron

CuOx powders with diff erently shaped particles were firstly prepared via an electrochemical method by oxidation and dispersion of copper electrodes in an electrolyte solution under pulse alternating current (PAC). By means of X-ray diffraction (XRD) and scanning electron microscopy (SEM) the current density is found to have an influence on the morphology and composition of CuOx particles. Photocatalytic efficiency of CuOx towards methyl orange (MO) degradation under visible light was investigated. The prepared polyhedral particles show the best photocatalytic activity of 81 % towards MO comparing to octahedral and spherical particles with 70 and 61 %, respectively.

SIZE-INDUCED EFFECTS IN NANOSTRUCTURED NiFe2O4

2010 ◽  
Vol 24 (30) ◽  
pp. 5973-5985
Author(s):  
M. GUNES ◽  
H. GENCER ◽  
T. IZGI ◽  
V. S. KOLAT ◽  
S. ATALAY
Keyword(s):  
Electron Microscopy ◽  
Annealing Temperature ◽  
Structural Parameters ◽  
Hydrothermal Process ◽  
Lattice Parameter ◽  
Effect Of Temperature ◽  
Vibrating Sample Magnetometer ◽  
X Ray Diffraction ◽  
X Ray ◽  
Scanning Electron

NiFe 2 O 4 nanoparticles were successfully prepared by a hydrothermal process, and the effect of temperature on them was studied. The particles were annealed at various temperatures ranging from 413 to 1473 K. Studies were carried out using powder X-ray diffraction, scanning electron microscopy, infrared spectroscopy, differential thermal analysis, thermogravimetric analysis and a vibrating sample magnetometer. The annealing temperature had a significant effect on the magnetic and structural parameters, such as the crystallite size, lattice parameter, magnetization and coercivity.

The Development of Antibiotics Based on Nanostructured Manganese Oxide; Understanding Mechanism from Fundamental Aspects to Application

2020 ◽  
Vol 20 (12) ◽  
pp. 7618-7628
Author(s):  
Ayesha Taj ◽  
Rabisa Zia ◽  
Sadaf Hameed ◽  
Adnan Mujahid ◽  
Asma Rehman ◽  
...  
Keyword(s):  
Escherichia Coli ◽  
Bacillus Subtilis ◽  
Manganese Oxide ◽  
Bacterial Resistance ◽  
Bacterial Species ◽  
Spherical Particles ◽  
X Ray ◽  
Atomic Force ◽  
Uv Visible ◽  
Scanning Electron

The emergence of bacterial resistance to currently available antibiotics emphasized the urgent need for new antibacterial agents. Nanotechnology-based approaches are substantially contributing to the development of effective and better-formulated antibiotics. Here, we report the synthesis of stable manganese oxide nanostructures (MnO NS) by a facile, one-step, microwave-assisted method. Asprepared MnO NS were thoroughly characterized by atomic force microscopy (AFM), field emission scanning electron microscopy (FESEM), dynamic light scattering (DLS), UV-Visible spectroscopy and X-ray powder diffraction (XRD). UV-Visible spectra give a sharp absorption peak at a maximum wavelength of 430 nm showed surface plasmon resonance (SPR). X-ray diffraction (XRD) profile demonstrated pure phase and crystalline nature of nanostructures. Morphological investigations by a scanning electron microscope showed good dispersity with spherical particles possessing a size range between 10–100 nm. Atomic force microscope data exhibited that the average size of MnO NS can be controlled between 25 nm to 150 nm by a three-fold increment in the amount of stabilizer (o-phenylenediamine). Antimicrobial activity of MnO NS on both gram-positive (Bacillus subtilis) and gram-negative (Escherichia coli) bacterial strains showed that prepared nanostructures were effective against microorganisms. Further, this antibacterial activity was found to be dependent on nanoparticles (NPs) size and bacterial species. These were more effective against Bacillus subtilis (B. subtilis) as compared to Escherichia coli (E. coli). Considering the results together, this study paves the way for the formulation of similar nanostructures as effective antibiotics to kill other pathogens by a more biocompatible platform. This is the first report to synthesize the MnO NS by green approach and its antibacterial application.

SiO2ZrO2 Thin Films as Low Temperature NO2 and O3 Sensors

2015 ◽  
Vol 1088 ◽  
pp. 81-85 ◽  
Author(s):  
T.N. Myasoedova ◽  
Victor V. Petrov ◽  
Nina K. Plugotarenko ◽  
Dmitriy V. Sergeenko ◽  
Galina Yalovega ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Low Temperature ◽  
Annealing Temperature ◽  
Sol Gel ◽  
X Ray Diffraction ◽  
X Ray ◽  
Operating Temperatures ◽  
Scanning Electron

Thin SiO2ZrO2films were prepared, up to 0.2 μm thick, by means of the sol–gel technology and characterized by a Scanning electron microscopy and X-ray diffraction. It is shown the presence of monoclinic, cubic and tetragonal phases of ZrO2in the SiO2matrix. The crystallites sizes depend on the annealing temperature of the film and amount to 35 and 56 nm for the films annealed at 773 and 973 K, respectively. The films resistance is rather sensitive to the presence of NO2and O3impurity in air at lower operating temperatures in the range of 30-60°C.

Preparation and Characterization of A Composite Obtained through Ti (IV) and Phosphoric Acid

2014 ◽  
Vol 775-776 ◽  
pp. 97-101
Author(s):  
Loanda Raquel Cumba ◽  
U.O. Bicalho ◽  
D.R. Carmo
Keyword(s):  
Phosphoric Acid ◽  
Titanium Isopropoxide ◽  
Deionized Water ◽  
Spherical Particles ◽  
X Ray Diffraction ◽  
X Ray ◽  
Electron Microscopies ◽  
Prepared Material ◽  
Scanning Electron

This paper describes the preparation and complementary characterization of a composite formed from the activation of titanium isopropoxide by phosphoric acid and deionized water (TiP).Techniques such as, X-ray diffraction (XRD), Raman , electronic (UV-vis) and Scanning electron microscopies (SEM) were used for characterization of this new composite formed. In the X-ray diffractogram of TIP was observed four intense peaks. A strong absorption was observed in the region 362-445 nm. The scanning electron microscopy of TiP, shows that the prepared material consists mostly of a cluster of spherical particles with diameters ranging from 2.35 to 2.60 μm.

Structural and Morphological Properties of HfxZr1-xO2 Thin Films Prepared by Pechini Route

2010 ◽  
Vol 644 ◽  
pp. 113-116
Author(s):  
L.A. García-Cerda ◽  
Bertha A. Puente Urbina ◽  
M.A. Quevedo-López ◽  
B.E. Gnade ◽  
Leo A. Baldenegro-Perez ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Annealing Temperature ◽  
Precursor Solution ◽  
Dip Coating ◽  
Morphological Properties ◽  
X Ray Diffraction ◽  
X Ray ◽  
Dip Coating Technique ◽  
Scanning Electron

In this study, HfxZr1-xO2 (0 < x < 1) thin films were deposited on silicon wafers using a dip-coating technique and by using a precursor solution prepared by the Pechini route. The effects of annealing temperature on the structure and morphological properties of the proposed films were investigated. HfxZr1-xO2 thin films with 1, 3 and 5 layers were annealed in air for 2 h at 600 and 800 °C and the structural and morphological properties studied by X-ray diffraction (XRD) and scanning electron microscopy (SEM). XRD results show that the films have monoclinic and tetragonal structure depending of the Hf and Zr concentration. SEM photographs show that all films consist of nanocrystalline grains with sizes in the range of 6 - 13 nm. The total film thickness is about 90 nm.

Influence of Annealing Time on Microstructure of Ni-W Alloys

2013 ◽  
Vol 747-748 ◽  
pp. 613-618
Author(s):  
Qiao Zhang ◽  
Shu Hua Liang ◽  
Chen Zhang ◽  
Jun Tao Zou
Keyword(s):  
Electron Microscopy ◽  
Solid Solution ◽  
Grain Size ◽  
Grain Boundaries ◽  
Annealing Time ◽  
Single Phase ◽  
X Ray Diffraction ◽  
X Ray ◽  
Average Grain Size ◽  
Scanning Electron

The as-cast Ni-W alloys with 15wt%W, 25wt%W and 30wt%W were annealed in hydrogen at 1100. The effect of the annealing time on the microstructure of Ni-W alloys was studied, and the phase constituents and microstructure of annealed Ni-W alloys were characterized by the X-ray diffraction (XRD) and scanning electron microscopy (SEM). The results showed that no any phase changed for Ni-15%W, Ni-25%W and Ni-30%W alloys annealed for 60 min, 90 min and 150 min, which were still consisted of single-phase Ni (W) solid solution. However, microstructure had a significant change after annealing. With increase of annealing time, the microstructure of Ni-15%W alloy became more uniform after annealing for 90 min, and the average grain size was 95μm, whereas the grain size of Ni-15%W alloy increased significantly after annealing for 150 min. For Ni-25%W and Ni-30%W, there was no obvious change on the grain size with increase of annealing time, and the amount of oxides at grain boundaries gradually reduced. After annealing for 150 min, the impurities at grain boundaries almost disappeared. Subsequently, the annealing at 1100 for 150 min was beneficial for the desired microstructure of Ni-25%W and Ni-30%W alloys.

Doped ZnO Nanowires Obtained by Thermal Annealing

2007 ◽  
Vol 7 (2) ◽  
pp. 700-703 ◽  
Author(s):  
C. X. Shan ◽  
Z. Liu ◽  
C. C. Wong ◽  
S. K. Hark
Keyword(s):  
Thermal Annealing ◽  
Doping Concentration ◽  
Annealing Temperature ◽  
Zno Nanowires ◽  
X Ray Diffraction ◽  
X Ray ◽  
Doped Zno ◽  
Znse Nanowires ◽  
Annealing Method ◽  
Scanning Electron

Doped ZnO nanowires were prepared in a very simple and inexpensive thermal annealing method using ZnSe nanowires as a precursor. As doped, P doped, and As/P codoped ZnO nanowires were obtained in this method. X-ray diffraction shows that the zincblende ZnSe nanowires were converted to doped wurtzite ZnO nanowires. The incorporation of the dopants was confirmed by energy dispersive X-ray spectroscopy. The doping concentration could be adjusted by changing the annealing temperature and duration. Scanning electron microscopy indicated that the morphology of the ZnSe nanowires was essentially retained after the annealing and doping process. Photoluminescence spectroscopy also verified the incorporation of the dopants into the nanowires.

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