Industrial applications of Raman microscopy

1992 ◽  
Vol 50 (2) ◽  
pp. 1502-1503
Author(s):  
D.L. Gerrard
Keyword(s):  
Laser Scanning ◽  
Near Infrared ◽  
Industrial Applications ◽  
Raman Microscopy ◽  
Inorganic Materials ◽  
X Ray ◽  
Spatially Resolved ◽  
Wide Range ◽  
Recent Developments ◽  
Scanning Optical Microscopy

One of the major advantages of Raman spectroscopy for the industrial analyst is its capability for providing spatially resolved molecular information on a wide range of inorganic materials. Although the technique of Raman microscopy has been available for nearly twenty years its value in industrial analysis is still not widely appreciated. Recent developments in the use of near infrared excitation with Fourier transform spectrometers and of microline focus systems with charge-coupled devices as detectors have greatly expanded the value of the technique and should help it to appeal to a wider audience. Raman microscopy provides much valuable information in its own right and can often be used to solve analytical problems without reference to any other technique. However, it is usually of greatest value to the industrial analyst when used in conjunction with other microspectroscopy techniques such as scanning electron microscopy/energy dispersive X-ray analysis, infrared microscopy, proton-induced X-ray emission, laser ionisation mass analysis and laser scanning optical microscopy.

scholarly journals Distributed X-ray photon correlation spectroscopy data reduction using Hadoop MapReduce

2018 ◽  
Vol 25 (4) ◽  
pp. 1135-1143 ◽  
Author(s):  
Faisal Khan ◽  
Suresh Narayanan ◽  
Roger Sersted ◽  
Nicholas Schwarz ◽  
Alec Sandy
Keyword(s):  
Real Time ◽  
Photon Correlation Spectroscopy ◽  
Correlation Spectroscopy ◽  
Frame Rate ◽  
Computational Techniques ◽  
Complex Materials ◽  
Photon Correlation ◽  
X Ray ◽  
Wide Range ◽  
Recent Developments

Multi-speckle X-ray photon correlation spectroscopy (XPCS) is a powerful technique for characterizing the dynamic nature of complex materials over a range of time scales. XPCS has been successfully applied to study a wide range of systems. Recent developments in higher-frame-rate detectors, while aiding in the study of faster dynamical processes, creates large amounts of data that require parallel computational techniques to process in near real-time. Here, an implementation of the multi-tau and two-time autocorrelation algorithms using the Hadoop MapReduce framework for distributed computing is presented. The system scales well with regard to the increase in the data size, and has been serving the users of beamline 8-ID-I at the Advanced Photon Source for near real-time autocorrelations for the past five years.

scholarly journals Polarimetry and Physics of Be Star Envelopes (Review paper)

1982 ◽  
Vol 98 ◽  
pp. 77-93 ◽  
Author(s):  
George V. Coyne ◽  
Ian S. McLean
Keyword(s):  
High Resolution ◽  
Near Infrared ◽  
Theoretical Models ◽  
Geometrical Parameters ◽  
Be Stars ◽  
Intermediate Band ◽  
Wide Range ◽  
Recent Developments ◽  
Be Star ◽  
Polarization Studies

A review of the most recent developments in polarization studies of Be stars is presented. New polarization techniques for high-resolution spectropolarimetry and for near infrared polarimetry are described and a wide range of new observations are discussed. These include broadband, intermediate-band and multichannel observations of the continuum polarization of Be stars in the wavelenght interval 0.3–2.2 microns, high resolution (0.5 Å) line profile polarimetry of a few stars and surveys of many stars for the purposes of statistical analyses. The physical significance of the observational material is discussed in the light of recent theoretical models. Emphasis is placed on the physical and geometrical parameters of Be star envelopes which polarimetry helps to determine.

Industrial Applications of Near-Infrared Chemical Imaging Microscopy

2001 ◽  
Vol 7 (S2) ◽  
pp. 162-163
Author(s):  
EN Lewis ◽  
LH Kidder ◽  
KS Haber
Keyword(s):  
Spatial Distribution ◽  
Near Infrared ◽  
Imaging System ◽  
Raw Materials ◽  
Single Point ◽  
Nir Spectroscopy ◽  
Chemical Imaging ◽  
Industrial Applications ◽  
Chemical Information ◽  
Spatially Resolved

Single point near-infrared (NIR) spectroscopy is used extensively for characterizing raw materials and finished products in a wide variety of industries: polymers, paper, film, pharmaceuticals, paintings and coatings, food and beverages, agricultural products. As advanced industrial materials become more complex, their functionality is often determined by the spatial distribution of their discrete sample constituents. However, conventional single point NIR spectroscopy cannot adequately probe the interrelationship between the spatial distribution of sample components with the physical properties of the sample. to fully characterize these samples, it is necessary to probe simultaneously spatial and chemical heterogeneity and correlate these properties with sample characteristics.Recently, we have developed a novel NIR imaging spectrometer that can deliver spatially resolved chemical information very rapidly. in contrast to conventional, single point NIR spectrometers, the imaging system uses an infrared focal-plane array (FPA) to collect up to 76,800 complete spectra, one for each pixel on the array, in approximately one minute.

scholarly journals Spatial segregation of dust grains in transition disks

2019 ◽  
Vol 624 ◽  
pp. A7 ◽  
Author(s):  
M. Villenave ◽  
M. Benisty ◽  
W. R. F. Dent ◽  
F. Ménard ◽  
A. Garufi ◽  
...  
Keyword(s):  
Radiative Transfer ◽  
Near Infrared ◽  
Scattered Light ◽  
Radiative Transfer Model ◽  
Occurrence Rate ◽  
Transfer Model ◽  
Star Forming ◽  
Spatially Resolved ◽  
Wide Range ◽  
Transition Disks

Context. The mechanisms governing the opening of cavities in transition disks are not fully understood. Several processes have been proposed, but their occurrence rate is still unknown. Aims. We present spatially resolved observations of two transition disks, and aim at constraining their vertical and radial structure using multiwavelength observations that probe different regions of the disks and can help understanding the origin of the cavities. Methods. We have obtained near-infrared scattered light observations with VLT/SPHERE of the transition disks 2MASS J16083070-3828268 (J1608) and RXJ1852.3-3700 (J1852), located in the Lupus and Corona Australis star-forming regions respectively. We complement our datasets with archival ALMA observations, and with unresolved photometric observations covering a wide range of wavelengths. We performed radiative transfer modeling to analyze the morphology of the disks, and then compare the results with a sample of 20 other transition disks observed with both SPHERE and ALMA. Results. We detect scattered light in J1608 and J1852 up to a radius of 0.54′′ and 0.4′′ respectively. The image of J1608 reveals a very inclined disk (i ~ 74°), with two bright lobes and a large cavity. We also marginally detect the scattering surface from the rear-facing side of the disk. J1852 shows an inner ring extending beyond the coronagraphic radius up to 15 au, a gap and a second ring at 42 au. Our radiative transfer model of J1608 indicates that the millimeter-sized grains are less extended vertically and radially than the micron-sized grains, indicating advanced settling and radial drift. We find good agreement with the observations of J1852 with a similar model, but due to the low inclination of the system, the model remains partly degenerate. The analysis of 22 transition disks shows that, in general, the cavities observed in scattered light are smaller than the ones detected at millimeter wavelengths. Conclusions. The analysis of a sample of transition disks indicates that the small grains, well coupled to the gas, can flow inward of the region where millimeter grains are trapped. While 15 out of the 22 cavities in our sample could be explained by a planet of less than 13 Jupiter masses, the others either require the presence of a more massive companion or of several low-mass planets.

scholarly journals Structural Health Monitoring Using Fibre Optic Acoustic Emission Sensors

Sensors ◽  
2020 ◽  
Vol 20 (21) ◽  
pp. 6369
Author(s):  
James Owen Willberry ◽  
Mayorkinos Papaelias
Keyword(s):  
Acoustic Emission ◽  
Condition Monitoring ◽  
Electromagnetic Interference ◽  
Damage Evolution ◽  
High Refractive Index ◽  
Industrial Applications ◽  
Fibre Optic ◽  
Wide Range ◽  
Recent Developments ◽  
Acoustic Emission Sensors

Acoustic emission (AE) is widely used for condition monitoring of critical components and structures. Conventional AE techniques employ wideband or resonant piezoelectric sensors to detect elastic stress waves propagating through various types of structural materials, including composites during damage evolution. Recent developments in fibre optic acoustic emission sensors (FOAES) have enabled new ways of detecting and monitoring damage evolution using AE. An optical fibre consists of a core with a high refractive index and a surrounding cladding. The buffer layer and outer jacket both act as protective polymer layers. Glass optical fibres can be used for manufacturing AE sensors of sufficiently small size to enable their embedding into fibre-reinforced polymer composite materials. The embedding process protects the FOAES against environmental stresses prolonging operational lifetime. The immunity of FOAES to electromagnetic interference makes this type of sensor attractive for condition monitoring purposes across a wide range of challenging operational environments. This paper provides an exhaustive review of recent developments on FOAES including their fundamental operational principles and key industrial applications.

scholarly journals Unravelling strong electronic interlayer and intralayer correlations in a transition metal dichalcogenide

2021 ◽  
Vol 12 (1) ◽  
Author(s):  
T. J. Whitcher ◽  
Angga Dito Fauzi ◽  
D. Caozheng ◽  
X. Chi ◽  
A. Syahroni ◽  
...  
Keyword(s):  
Transition Metal ◽  
Near Infrared ◽  
Theoretical Calculations ◽  
High Energy ◽  
Low Energy ◽  
Great Effort ◽  
Energy Bands ◽  
Electronic Correlations ◽  
X Ray ◽  
Wide Range

AbstractElectronic correlations play important roles in driving exotic phenomena in condensed matter physics. They determine low-energy properties through high-energy bands well-beyond optics. Great effort has been made to understand low-energy excitations such as low-energy excitons in transition metal dichalcogenides (TMDCs), however their high-energy bands and interlayer correlation remain mysteries. Herewith, by measuring temperature- and polarization-dependent complex dielectric and loss functions of bulk molybdenum disulphide from near-infrared to soft X-ray, supported with theoretical calculations, we discover unconventional soft X-ray correlated-plasmons with low-loss, and electronic transitions that reduce dimensionality and increase correlations, accompanied with significantly modified low-energy excitons. At room temperature, interlayer electronic correlations, together with the intralayer correlations in the c-axis, are surprisingly strong, yielding a three-dimensional-like system. Upon cooling, wide-range spectral-weight transfer occurs across a few tens of eV and in-plane p–d hybridizations become enhanced, revealing strong Coulomb correlations and electronic anisotropy, yielding a two-dimensional-like system. Our result shows the importance of strong electronic, interlayer and intralayer correlations in determining electronic structure and opens up applications of utilizing TMDCs on plasmonic nanolithrography.

Spatially-Resolved X-Ray Absorption fine Structure (XAFS) Spectroscopy Using Undulator Radiation Focused by Dynamically-Bent Elliptical Mirrors

1998 ◽  
Vol 4 (S2) ◽  
pp. 364-365
Author(s):  
S. R. Sutton ◽  
P. E. Eng ◽  
M. L. Rivers ◽  
M. Newville
Keyword(s):  
Complex Materials ◽  
X Ray ◽  
Xafs Spectroscopy ◽  
Advantages And Disadvantages ◽  
Spatially Resolved ◽  
Wide Range ◽  
Glass Capillaries ◽  
Solar System Bodies ◽  
Redox Evolution ◽  
X Ray Absorption

X-ray absorption spectroscopy (XANES and EXAFS) applied with x-ray microprobe instrumentation (figures 1) can be used for studying the electronic structure of specific elements in complex materials in a spatially-resolved manner (figure 2). Such techniques are valuable in a wide range of studies including hydrothermal fluid processes, migration and encapsulation of toxic and radioactive wastes, and redox evolution of solar system bodies.One of the major technical challenges in this work is the production of high flux microbeams from high power, hard x-ray synchrotron sources. Some of the microbeam technologies under development include tapered glass capillaries, zone plates, and elliptical mirrors. Each approach has advantages and disadvantages and the optimum microfocusing device depends on the particular experiment.One of the most versatile of these devices is the dynamically bent, elliptical mirror, especially when a pair of mirrors are arranged in a Kirkpatrick-Baez (KB) geometry to provide two-dimensional focusing. This versatility derives mainly from four attributes.

X-Ray Fluorescence Analysis of High Z Materials with Mercuric Iodide Room Temperature Detectors

1980 ◽  
Vol 24 ◽  
pp. 303-309 ◽  
Author(s):  
J. Nissenbaum ◽  
A. Holzer ◽  
M. Roth ◽  
M. Schieber
Keyword(s):  
Solid State ◽  
Energy Resolution ◽  
Room Temperature ◽  
Fluorescence Analysis ◽  
Industrial Applications ◽  
Mercuric Iodide ◽  
Portable Xrf ◽  
X Ray ◽  
State Radiation ◽  
Wide Range

AbstractMercuric iodide HgI2 room temperature solid state radiation spectrometers having 4% energy resolution at 100 KeV detected the x-ray fluorescence (XRF) of the K shell of intermediate and high Z elements. The excitation of the K shells which emit XRF more energetic than 60 KeV was achieved with 7mCi collimated 57Co and for XRF less energetic than 60 KeV the excitation was done with a 10mCi 241Am source. The K shell XRF spectra of a 1:1 mixture of U and Th, and also of the single elements of Au, Tb, Ba, Ag, Mo, and Rb are shown. The results prove the feasibility of developing mercuric iodide portable XRF spectrometers which operate at room temperature and which have a wide range of geochemical and industrial applications.

X-Ray Microanalysis in the Environmental SEM Using Mapping and Fourier Deconvolution Techniques

2001 ◽  
Vol 7 (S2) ◽  
pp. 708-709
Author(s):  
Matthew R. Phillips ◽  
Brendan Griffin ◽  
Dominque Drouin ◽  
Clive Nockolds ◽  
Guy Remond
Keyword(s):  
Industrial Applications ◽  
Chamber Pressure ◽  
Variable Pressure ◽  
Natural State ◽  
Specimen Preparation ◽  
X Rays ◽  
X Ray ◽  
Wide Range ◽  
Fourier Deconvolution ◽  
Measurement Strategies

X-ray microanalysis of any type of specimen in its natural state without the use of conventional SEM specimen preparation techniques has immense potential in a wide range of scientific and industrial applications. This capability would be particularly useful in microanalysis applications where it is highly desirable to preserve the integrity of the specimen, for example in semiconductor failure analysis and forensic investigations. in principle, this X-ray microanalysis goal can be achieved in an environmental or variable pressure scanning electron microscope (VPSEM) because specimen charging and vacuum stability problems are negated by the presence of a gas in the specimen chamber. However, the accuracy and spatial resolution of X-ray microanalysis in the VPSEM is significantly degraded by the chamber gas as it scatters primary beam electrons, generating spurious X-rays far from the analysis point. to date, two different X-ray measurement strategies have been developed to facilitate X-ray microanalysis at high chamber pressure in the VPSEM.

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