Effect of thermal cycling on tensile behaviour of SAC305 solder

2017 ◽  
Author(s):  
Xu Long ◽  
Yao Yao ◽  
Yanpei Wu ◽  
Weijuan Xia ◽  
Lianfeng Ren
Keyword(s):  
Thermal Cycling ◽  
Tensile Behaviour ◽  
Sac305 Solder

Creep Behavior of Various Materials Within PBGA Packages Subjected to Thermal Cycling Loading

2020 ◽  
Author(s):  
Abdullah Fahim ◽  
Kamrul Hasan ◽  
Jeffrey C. Suhling ◽  
Pradeep Lall
Keyword(s):  
Solder Joint ◽  
Thermal Cycling ◽  
Creep Behavior ◽  
Creep Deformation ◽  
Nanoindentation Test ◽  
Electronic Packages ◽  
Sac305 Solder ◽  
Die Attachment ◽  
Nanoindentation Technique ◽  
Solder Mask

Abstract Electronic packages are frequently exposed to a thermal cycling environment in real life applications. Particularly, the plastic ball grid array (PBGA) is one of the most widely used electronic package, and consists of various component materials, e.g. solder joint, silicon die, die attachment adhesive, mold compound, solder mask, etc. All of these materials play a significant role on the reliability of the overall package. Failure under creep deformation is one of the significant failure mode for electronic packages. Hence, it is important to study their creep behavior and evolution under the thermal cycling environment. These changes must be evaluated in order to understand and predict their failure behavior due to creep damage in operation. In our previous study, evolution of mechanical properties of SAC305 solder joints in a PBGA package up to 250 thermal cycles was evaluated using the nanoindentation technique. In this work, nanoindentation technique was utilized to understand the evolution of creep behavior of the SAC305 solder joint, die attachment adhesive, silicon die, and solder mask material for various durations of thermal cycling. Test specimens were first prepared by cross sectioning a PBGA package to reveal the different materials, followed by surface polishing to facilitate SEM imaging and nanoindentation testing. After preparation, the package samples were thermally cycled from T = −40 to 125 °C in an environmental chamber. At various points in the cycling (e.g. after 0, 50, 100, 250 and 500 cycles), the package was taken out from the chamber, and nanoindentation was performed on above mentioned materials to obtain creep behavior at room temperature (25 °C). From the nanoindentation test data, it was found that creep deformation of SAC305 increased upto 500 cycles. Die attachment and solder mask materials showed initial decrease in creep deformation up to 250 cycles and then increased value at 500 cycles. As expected, the silicon die material does not show any significant change in creep deformation behavior upto 500 cycles.

The Reliability Impact of Reballing COTS Pb-Free BGAs to Sn/Pb for Military Applications

2011 ◽  
Vol 2011 (1) ◽  
pp. 000703-000710
Author(s):  
Greg Caswell ◽  
Joelle Arnold
Keyword(s):  
Thermal Cycling ◽  
Hazardous Substances ◽  
Post Processing ◽  
Sac305 Solder ◽  
Post Process ◽  
Physical Testing ◽  
Solder Balls ◽  
Commercial Off The Shelf ◽  
Tin Silver Copper ◽  
The Cost

The electronics assembly market has experienced a material shift from lead (Pb) based solders to Pb-free solders. This is a result of the widespread adoption of Reduction of Hazardous Substances (RoHS) legislation and practices in commercial industry. As a result, it is becoming increasingly difficult to procure commercial off-the-shelf (COTS) components with tin-lead (SnPb) solder balls or finish. There are essentially three responses to the scarcity of acceptable SnPb parts: custom order, post process or adapt. Custom ordering parts with SnPb finishes negates the benefits of COTS based acquisition; however, has a reduced reliability risk because the material and processes are known. Reprocessing parts once in house saves money because the parts are COTS, but expends money and resources by performing post processing on them. Also, the additional touch labor and handling increases the risk of damaging the part. Finally, adapting to Pb-free finishes is the preferred long term approach because it preserves the cost benefits of using COTS parts and does not require post processing. It is the riskiest approach due to the lack of historical data in the DoD environment. This paper presents results regarding reballing 208 I/O Ball Grid Array (BGA) parts from tin-silver-copper (SAC305) solder to SnPb eutectic solder. It is important to understand the reliability risks associated with the reballing procedure, particularly as it relates to thermal cycling, shock and vibration environments. Three major efforts will be presented to answer these concerns. First, a survey of reballing vendors was performed to better understand the processes and variables associated with that industry. The results of that survey were used to down-select to five vendors that were used for the physical testing portion of the effort. Finally, physical testing consisting of thermal cycling, shock, and vibration was performed. The physical testing was performed on parts from the five different reballing vendors as well as native SnPb parts and native SAC305 parts. The results of these activities will be presented.

Effects of Corner/Edge Bonding and Underfill Properties on the Thermal Cycling Performance of Lead Free Ball Grid Array Assemblies

2012 ◽  
Vol 134 (1) ◽  
Author(s):  
P. Borgesen ◽  
D. Blass ◽  
M. Meilunas
Keyword(s):  
Thermal Cycling ◽  
Flip Chip ◽  
Printed Circuit Board ◽  
Ball Grid Array ◽  
Cycling Performance ◽  
Circuit Board ◽  
Lead Free ◽  
Sac305 Solder ◽  
Solder Balls ◽  
Selection Of

Underfilling will almost certainly improve the performance of an area array assembly in drop, vibration, etc. However, depending on the selection of materials, the thermal fatigue life may easily end up worse than without an underfill. This is even more true for lead free than for eutectic SnPb soldered assemblies. If reworkability is required, the bonding of the corners or a larger part of the component edges to the printed circuit board (PCB), without making contact with the solder joints, may offer a more attractive materials selection. A 30 mm flip chip ball grid array (FCBGA) component with SAC305 solder balls was attached to a PCB and tested in thermal cycling with underfills and corner/edge bonding reinforcements. Two corner bond materials and six reworkable and nonreworkable underfills with a variety of mechanical properties were considered. All of the present underfills reduced the thermal cycling performance, while edge bonding improved it by up to 50%. One set of the FCBGAs was assembled with a SnPb paste and underfilled with a soft reworkable underfill. Surprisingly, this improved the thermal cycling performance slightly beyond that of the nonunderfilled assemblies, providing up to three times better life than for those assembled with a SAC305 paste.

Effect of Corner Staking on the Fatigue Life of BGA Under Thermal Cycling

2017 ◽  
Author(s):  
Deng Yun Chen ◽  
Michael Osterman
Keyword(s):  
Fatigue Life ◽  
Thermal Cycling ◽  
Material Properties ◽  
Solder Joints ◽  
Material Selection ◽  
Temperature Cycling ◽  
Sac305 Solder ◽  
Element Analysis ◽  
Bga Packages ◽  
The Impact

Solder interconnects in electronic assemblies are susceptible to failures due to environmental high strain rate impact and cyclic stresses. To mitigate the failures, adhesive bonds can be added after the solder assembly process to provide additional mechanical support. For ball grid array (BGA) packages, the adhesive is normally applied to the corners of the package and referred to as corner staking. In addition to corner staking, underfill is also a strategy used to mitigate the stresses on the solder joints. While components with underfill has been widely studied, the study of the impact of corner staking on the reliability of packages remains limited. This paper presents a study of corner-staked BGA packages with tin-3.0 silver-0.5 copper (SAC305) solder subjected to temperature cycling. Experimental temperature cycling is conducted to examine impact of the selected corner staking material on the fatigue life of BGAs. Further, finite element analysis is conducted to understand the influence of material properties of staking material on the fatigue life of BGAs. The result of the study indicates that the presence of corner staking, with selected material properties, reduces the damage on the solder joints under thermal cycling, and thus increases its fatigue life by about 80%. This paper may serve as a guidance for staking material selection to improve the fatigue life of solder joints of BGAs under thermal cycling.

scholarly journals Reliability Assessment of Preloaded Solder Joint Under Thermal Cycling

2012 ◽  
Vol 134 (4) ◽  
Author(s):  
Da Yu ◽  
Hohyung Lee ◽  
Seungbae Park
Keyword(s):  
Solder Joint ◽  
Thermal Cycling ◽  
Thermal Fatigue ◽  
Heat Sink ◽  
Heat Dissipation ◽  
Failure Modes ◽  
Compressive Loading ◽  
Interfacial Thermal Resistance ◽  
Sac305 Solder

The ever increasing power density in modern semiconductor devices requires heat dissipation solution such as heat sink to remove heat away from the device. A compressive loading is usually applied to reduce the interfacial thermal resistance between package and heat sink. In this paper, both experimental approaches and numerical modeling were employed to study the effect of compressive loading on the interconnect reliability under thermal cycling conditions. A special loading fixture which simulated the heat sink was designed to apply compressive loading to the package. The JEDEC standard thermal cycle tests were performed and the resistance of daisy chained circuits was in situ measured. The time to crack initiation and time to permanent failure were identified separately based on in situ resistance measurement results. Failure analysis has been performed to identify the failure modes of solder joint with and without the presence of compressive loading. A finite element based thermal-fatigue life prediction model for SAC305 solder joint under compressive loading was also developed to understand the thermal-fatigue crack behaviors of solder joint and successfully validated with the experimental results.

scholarly journals On the Tensile Behaviour of Bio-Sourced 3D-Printed Structures from a Microstructural Perspective

Polymers ◽  
2020 ◽  
Vol 12 (5) ◽  
pp. 1060
Author(s):  
Sofiane Guessasma ◽  
Sofiane Belhabib ◽  
Abdullah Altin
Keyword(s):  
Mechanical Properties ◽  
Finite Element ◽  
Thermal Cycling ◽  
Mechanical Performance ◽  
Major Influence ◽  
Control Factor ◽  
Tensile Behaviour ◽  
Leading Role ◽  
3D Printed ◽  
Micro Tomography

The influence of the microstructural arrangement of 3D-printed polylactic acid (PLA) on its mechanical properties is studied using both numerical and experimental approaches. Thermal cycling during the laying down of PLA filament is investigated through infra-red measurements for different printing conditions. The microstructure induced by 3D printing is determined using X-ray micro-tomography. The mechanical properties are measured under tensile testing conditions. Finite element computation is considered to predict the mechanical performance of 3D-printed PLA by converting the acquired 3D images into structural meshes. The results confirm the leading role of the printing temperature on thermal cycling during the laying down process. In addition, the weak influence of the printing temperature on the stiffness of 3D-printed PLA is explained by the relatively small change in porosity content. However, the influence of the printing temperature on the ultimate properties is found to be substantial. This major influence is explained from finite element predictions as an effect of pore connectivity which is found to be the control factor for tensile strength.

Nanoindentation Testing of SAC305 Solder Joints Subjected to Thermal Cycling Loading

2019 ◽  
Author(s):  
Abdullah Fahim ◽  
S. M. Kamrul Hasan ◽  
Jeffrey C. Suhling ◽  
Pradeep Lall
Keyword(s):  
Mechanical Properties ◽  
Solder Joint ◽  
Thermal Cycling ◽  
Creep Behavior ◽  
Solder Joints ◽  
Test Results ◽  
Sac305 Solder ◽  
Nanoindentation Testing ◽  
Single Grain ◽  
Cycling Loading

Abstract Solder joints in electronic packages are frequently exposed to thermal cycling environment. Such exposures can occur in real life application as well as in accelerated thermal cycling tests used for the fatigue behavior characterization. Because of temperature variations and CTE mismatches of the assembly materials, cyclic temperature leads to damage accumulation and material property evolution in the solder joints. This eventually results in crack initiation, and subsequent crack growth and failure. In this study, the nanoindentation technique was used to understand the evolution of mechanical properties (modulus, hardness and creep behavior) of SAC305 BGA solder joints and Cu pad subjected to thermal cycling loading for various durations. In addition, microstructural changes in those joints that occur during thermal cycling were observed using both SEM and optical microscopy. BGA solder joint strip specimens were first prepared by cross sectioning BGA assemblies followed by surface polishing to facilitate SEM imaging and nanoindentation testing. The strip specimens were chosen to contain several single grain solder joints. This enabled large regions of solder material with equivalent mechanical behavior, which could then be indented several times after various durations of cycling. After preparation, the solder joint strip samples were thermally cycled from T = −40 to 125 °C in an environmental chamber. At various points in the cycling (e.g. after 0, 50, 100, and 250 cycles), the package was taken out from the chamber, and nanoindentation was performed on each single grain joint and joint Cu pads to obtain the modulus, hardness, and creep behavior at 25 °C. This allowed the evolution of the mechanical properties with the duration of thermal cycling to be determined. Moreover, microstructural changes were also observed after various durations of cycling using optical microscopy. From the nanoindentation test results, it was found that the modulus and hardness of the SAC305 solder joints dropped significantly with thermal cycling. However, the Cu pad did not show any change in the mechanical behavior during cycling. Moreover, the nanoindentation creep test results showed significant increases in the creep deformation for solder joints whereas Cu pad did now show any significant changes in creep behavior when both of them were subjected to thermal cycling up to 250 cycles.

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