EFFECT OF LOW-TEMPERATURE ANNEALING ON STRUCTURE AND OPTICAL PROPERTIES OF AMORPHOUS TRIS(8-HYDROXYQUINOLINE) ALUMINUM FILMS

2019 ◽  
Vol 26 (04) ◽  
pp. 1850183 ◽  
Author(s):  
FENG JIANG ◽  
ZHIYONG PANG ◽  
HUIMIN YUAN ◽  
ZHIXIAN WEI ◽  
WANFENG XIE ◽  
...  
Keyword(s):  
Blue Shift ◽  
Optical Transmittance ◽  
Visible Range ◽  
Photoluminescence Spectra ◽  
X Ray Diffraction ◽  
Scanning Electronic Microscopy ◽  
Amorphous Films ◽  
Aluminum Films ◽  
X Ray ◽  
Low Temperature Annealing

Needle-shaped nanostructured tris(8-hydroxyquinoline) aluminum nanowires (Alq3) have been obtained by annealing Alq3 amorphous films at 150∘C which is lower than the glass transition temperature of Alq3 (172∘C). The growth of Alq3 nanowires is attributed to the migration and stacking of Alq3 molecules which acquire thermal energy from the annealing process. X-ray diffraction analysis and scanning electronic microscopy spectra show that the Alq3 nanowires are composed of the well-known [Formula: see text]-phase Alq3. The intensity of the photoluminescence spectra firstly increases and then decreases as the annealing time increases, along with a spectral blue shift. The optical transmittance spectra of the annealed Alq3 films show a smaller average absorption in the visible range and a wider optical bandgap compared with that of the amorphous films, as a result of the decrease of [Formula: see text] overlapping in the Alq3 molecules.

Optical, electrical, and structural properties of Fe-doped CuAlO2 thin films

2019 ◽  
Vol 12 (01) ◽  
pp. 1850106
Author(s):  
Xueping Zhao ◽  
Ming Zhang ◽  
Pucun Bai ◽  
Xiaohu Hou ◽  
Fei Liu ◽  
...  
Keyword(s):  
Optical Band Gap ◽  
Impurity Band ◽  
Optical Transmittance ◽  
Visible Range ◽  
X Ray Diffraction ◽  
X Ray ◽  
Fe Content ◽  
Average Transmittance ◽  
Concentration Enhancement ◽  
Structural And Optoelectronic Properties

The influence of Fe content on the structural and optoelectronic properties of Fe-doped CuAlO2 films was studied. X-ray diffraction (XRD) results revealed that all annealed films had a pure delafossite phase. Optical transmittance spectra showed that Fe-doped films exhibit an obvious change in the 340–380[Formula: see text]nm region compared to undoped CuAlO2, and optical band gap analyses confirmed the formation of impurity band levels within the bandgap. The average transmittance of CuAl[Formula: see text]FexO2 is around 45–55% in the visible range, and transmittance in this region decreases with increasing Fe concentration. Increased conductivity was observed due to the introduction of Fe and subsequent carrier concentration enhancement. The conductivity in a CuAl[Formula: see text]Fe[Formula: see text]O2 film was maximized at [Formula: see text][Formula: see text]S[Formula: see text]cm[Formula: see text].

scholarly journals Preparation and Characterization of CoevaporatedCd1−xZnxSAlloy Thin Films

2011 ◽  
Vol 2011 ◽  
pp. 1-5 ◽  
Author(s):  
Wei Li ◽  
Jiayi Yang ◽  
Zhen Sun ◽  
Lianghuan Feng ◽  
Jingquan Zhang ◽  
...  
Keyword(s):  
Thin Films ◽  
Fluorescence Spectra ◽  
Zinc Content ◽  
Blue Shift ◽  
Optical Transmittance ◽  
X Ray Diffraction ◽  
X Ray ◽  
Novel Structure ◽  
Vegard’S Law

Cd1-xZnxSthin films have been prepared by the vacuum coevaporation method. The structural, compositional, and optical properties ofCd1-xZnxSthin films have been investigated using X-ray diffraction, X-ray fluorescence, and optical transmittance spectra. As-depositedCd1-xZnxSthin films are polycrystalline and show the cubic structure forx=1and hexagonal one forx<1with the highly preferential orientation. The composition ofCd1-xZnxSthin films determined from Vegard's law and quartz thickness monitors agrees with that determined from the X-ray fluorescence spectra. Optical absorption edge of optical transmittance forCd1-xZnxSthin films shows a blue shift with the increase of the zinc content. The band gap forCd1-xZnxSthin films can be tuned nonlinearly withxfrom about 2.38 eV for CdS to 3.74 eV for ZnS. A novel structure for CuInS2-based solar cells with aCd0.4Zn0.6Slayer is proposed in this paper.

scholarly journals Structural and Enhanced Optical Properties of Stabilized γ‒Bi2O3 Nanoparticles: Effect of Oxygen Ion Vacancies

Nanomaterials ◽  
2020 ◽  
Vol 10 (6) ◽  
pp. 1023 ◽  
Author(s):  
Ashish Chhaganlal Gandhi ◽  
Chia-Liang Cheng ◽  
Sheng Yun Wu
Keyword(s):  
Room Temperature ◽  
Excess Oxygen ◽  
Ambient Atmosphere ◽  
Photoluminescence Spectra ◽  
X Ray Diffraction ◽  
X Ray ◽  
Band Emission ◽  
Oxygen Ion ◽  
Integrated Intensity ◽  
Effect Of Oxygen

We report the synthesis of room temperature (RT) stabilized γ–Bi2O3 nanoparticles (NPs) at the expense of metallic Bi NPs through annealing in an ambient atmosphere. RT stability of the metastable γ–Bi2O3 NPs is confirmed using synchrotron radiation powder X-ray diffraction and Raman spectroscopy. γ–Bi2O3 NPs exhibited a strong red-band emission peaking at ~701 nm, covering 81% integrated intensity of photoluminescence spectra. Our findings suggest that the RT stabilization and enhanced red-band emission of γ‒Bi2O3 is mediated by excess oxygen ion vacancies generated at the octahedral O(2) sites during the annealing process.

scholarly journals Controlled Synthesis of CuS and Cu9S5 and Their Application in the Photocatalytic Mineralization of Tetracycline

Catalysts ◽  
2021 ◽  
Vol 11 (8) ◽  
pp. 899
Author(s):  
Murendeni P. Ravele ◽  
Opeyemi A. Oyewo ◽  
Damian C. Onwudiwe
Keyword(s):  
Electron Microscopy ◽  
Visible Light ◽  
Blue Shift ◽  
X Ray Diffraction ◽  
X Ray ◽  
Copper Sulfides ◽  
Transmission Electron ◽  
Single Source Precursor ◽  
Pure Phase ◽  
Pure Phases

Pure-phase Cu2−xS (x = 1, 0.2) nanoparticles have been synthesized by the thermal decomposition of copper(II) dithiocarbamate as a single-source precursor in oleylamine as a capping agent. The compositions of the Cu2−xS nanocrystals varied from CuS (covellite) through the mixture of phases (CuS and Cu7.2S4) to Cu9S5 (digenite) by simply varying the temperature of synthesis. The crystallinity and morphology of the copper sulfides were studied using X-ray diffraction (XRD), scanning electron microscopy (SEM), and transmission electron microscopy (TEM), which showed pure phases at low (120 °C) and high (220 °C) temperatures and a mixture of phases at intermediate temperatures (150 and 180 °C). Covellite was of a spherical morphology, while digenite was rod shaped. The optical properties of these nanocrystals were characterized by UV−vis–NIR and photoluminescence spectroscopies. Both samples had very similar absorption spectra but distinguishable fluorescence properties and exhibited a blue shift in their band gap energies compared to bulk Cu2−xS. The pure phases were used as catalysts for the photocatalytic degradation of tetracycline (TC) under visible-light irradiation. The results demonstrated that the photocatalytic activity of the digenite phase exhibited higher catalytic degradation of 98.5% compared to the covellite phase, which showed 88% degradation within the 120 min reaction time using 80 mg of the catalysts. The higher degradation efficiency achieved with the digenite phase was attributed to its higher absorption of the visible light compared to covellite.

Luminescent Properties of Zn2SiO4:Eu3+,Dy3+ Phosphors via Sol-Gel Process

2012 ◽  
Vol 217-219 ◽  
pp. 733-736
Author(s):  
Xiu Mei Han ◽  
Shu Ai Hao ◽  
Ying Ling Wang ◽  
Gui Fang Sun ◽  
Xi Wei Qi
Keyword(s):  
Thermal Analysis ◽  
Ir Spectra ◽  
Sol Gel ◽  
Luminescent Properties ◽  
Photoluminescence Spectra ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sol Gel Process ◽  
Ft Ir

Zn2SiO4:Eu3+, Dy3+ phosphors have been prepared through the sol-gel process. X-ray diffraction (XRD), thermogravimetric and ddifferential thermal analysis (TG-DTA), FT-IR spectra and photoluminescence spectra were used to characterize the resulting phosphors. The results of XRD indicated that the phosphors crystallized completely at 1000oC. In Zn2SiO4:Eu3+,Dy3+ phosphors, the Eu3+ and Dy3+ show their characteristic red(613nm, 5D0-7F2), blue (481nm, 4F9/2–6H15/2) and yellow (577nm, 4F9/2–6H13/2) emissions.

scholarly journals c-Perpendicular Orientation of Poly(ʟ-lactide) Films

Polymers ◽  
2021 ◽  
Vol 13 (10) ◽  
pp. 1572
Author(s):  
Baku Nagendra ◽  
Paola Rizzo ◽  
Christophe Daniel ◽  
Lucia Baldino ◽  
Gaetano Guerra
Keyword(s):  
Low Temperature ◽  
Film Plane ◽  
Wide Angle ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
Amorphous Films ◽  
High Transparency ◽  
X Ray ◽  
Crystalline Forms ◽  
Induced Crystallization

Poly(ʟ-lactide) (PLLA) films, even of high thickness, exhibiting co-crystalline and crystalline α phases with their chain axes preferentially perpendicular to the film plane (c⊥ orientation) have been obtained. This c⊥ orientation, unprecedented for PLLA films, can be achieved by the crystallization of amorphous films as induced by low-temperature sorption of molecules being suitable as guests of PLLA co-crystalline forms, such as N,N-dimethylformamide, cyclopentanone or 1,3-dioxolane. This kind of orientation is shown and quantified by two-dimensional wide-angle X-ray diffraction (2D-WAXD) patterns, as taken with the X-ray beam parallel to the film plane (EDGE patterns), which present all the hk0 arcs centered on the meridian. PLLA α-form films, as obtained by low-temperature guest-induced crystallization, also exhibit high transparency, being not far from those of the starting amorphous films.

scholarly journals Properties and Analysis of Transparency Conducting AZO Films by Using DC Power and RF Power Simultaneous Magnetron Sputtering

2013 ◽  
Vol 2013 ◽  
pp. 1-6 ◽  
Author(s):  
Neng-Fu Shih ◽  
Jin-Zhou Chen ◽  
Yeu-Long Jiang
Keyword(s):  
Incident Light ◽  
Blue Shift ◽  
Light Wavelength ◽  
Rf Power ◽  
X Ray Diffraction ◽  
X Ray ◽  
Dc Power ◽  
Incident Light Wavelength ◽  
Significant Blue Shift ◽  
Sputtering System

DC power and RF power were introduced into the magnetic controlled sputtering system simultaneously to deposit AZO films in order to get an acceptable deposition rate with high quality transparency conducting thin film. The resistivity decreases with the RF power for the as-deposited samples. The resistivity of 6 × 10−4 Ω-cm and 3.5–4.5 × 10−4 Ω-cm is obtained for the as-deposited sample, and for all annealed samples, respectively. The transmittance of the AZO films with higher substrate temperature is generally above 80% for the incident light wavelength within 400–800 nm. The transmittance of the as-deposited samples reveals a clear blue shift phenomenon. The AZO films present (002) oriented preference as can be seen from the X-ray diffraction curves. All AZO films reveal compressive stress. The annealing process improves the electrical property of AZO films. A significant blue shift phenomenon has been found, which may have a great application for electrode in solar cell.

Effects of Indium Incorporation on the Optical Properties of ZnO Films

2006 ◽  
Vol 11-12 ◽  
pp. 159-162 ◽  
Author(s):  
Yong Ge Cao ◽  
Lei Miao ◽  
Sakae Tanemura ◽  
Yasuhiko Hayashi ◽  
Masaki Tanemura
Keyword(s):  
Optical Transmission ◽  
Full Width Half Maximum ◽  
Structural Disorder ◽  
Band Gaps ◽  
Zno Films ◽  
Photoluminescence Spectra ◽  
X Ray Diffraction ◽  
X Ray ◽  
Optical Band Gaps ◽  
Xrd Patterns

Transparent indium-doped ZnO (IZO) films with low In content (<6at%) were fabricated through radio-frequency (rf) helicon magnetron sputtering. Formation of In-Zn-O solid solution was confirmed by X-ray diffraction (XRD) patterns. Incorporation of indium into ZnO films enhances the optical transmission in the visible wavelength. The optical band-gaps slightly increase from 3.25eV (ZnO) to 3.28eV (In0.04Zn0.96O) and to 3.30eV (In0.06Zn0.94O) due to Burstain-Moss effect. The Urbach tail parameter E0, which is believed to be a function of structural disorder, increases from 79meV (ZnO), to 146meV (In0.04Zn0.96O), and to 173meV (In0.06Zn0.94O), which is consistent with increase of Full-Width Half-Maximum (FWHM) in corresponding XRD patterns. Decreasing in crystal quality with increasing indium concentration is also confirmed by photoluminescence spectra.

scholarly journals Growth, Optical and Microhardness Studies of 2-Aminothiazole- 3, 5-Dinitrobenzoic Acid Complex

2019 ◽  
Vol 1 (1) ◽  
pp. 42-45
Author(s):  
Tamiloli Devendhiran ◽  
Keerthika Kumarasamy ◽  
Mei–Ching Lin
Keyword(s):  
Room Temperature ◽  
Grown Crystal ◽  
Optical Transmittance ◽  
Dielectric Measurements ◽  
Slow Evaporation ◽  
X Ray Diffraction ◽  
Acid Complex ◽  
X Ray ◽  
Slow Evaporation Technique ◽  
Evaporation Technique

Single crystals of 2-Aminothiazole 3,5-Dinitrobenzoic acid has been synthesized and good quality optical crystals were grown by slow evaporation technique at room temperature. The crystallinity nature of the grown crystal was confirmed from X-ray diffraction technique. An optical transmittance study was also carried out by UV – Vis spectra. FTIR spectra confirm the presence of functional groups in the grown crystal. The dielectric measurements were carried out in the range of 50Hz to 2MHz. The dielectric constant was seen to increase exponentially at lower frequencies. The microhardness studies were carried out using Vickers hardness indenter. Photoluminescence study shows that maximum emission occurs at 435nm.

Changes in the Spectral Characteristics of Aluminum Films Deposited under Assisting Argon Ion Beam

2015 ◽  
Vol 1084 ◽  
pp. 11-15
Author(s):  
Sergey P. Umnov ◽  
Oleg Kh. Asainov ◽  
Svetlana N. Popova ◽  
Aleksey N. Lemachko
Keyword(s):  
Magnetron Sputtering ◽  
Ion Beam ◽  
Spectral Characteristics ◽  
Crystal Defects ◽  
X Ray Diffraction ◽  
Aluminum Films ◽  
X Ray ◽  
Ion Assistance ◽  
Argon Ion ◽  
Uv Range

High-reflectance aluminum films are widely used in applied optics. As part of this work, we deposited aluminum films on glass substrates by magnetron sputtering using argon ion beam assistance. The reflectivity of the films obtained was measured on the SF-256 spectrophotometer. The microstructure and topology of the films were examined with a transmission electron microscope (TEM), X-ray diffraction (XRD) and atomic force microscope (AFM). The studies have shown that the aluminum films deposited with ion assistance have higher reflectance in the UV range than the films formed by magnetron sputtering alone. The results of TEM and AFM measurements show that the geometric factor (crystallite size, surface roughness) is not the reason for the increase of reflectivity. X-ray diffraction analyses have shown a significant increase in microstress in the aluminum films deposited with ion assistance, which is caused by an increase in the defect density of the vacancy-type crystal structure. The results have shown that the increase in the density of crystal defects leads to an increase in reflectance in the UV range.

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