Measuring the length of objects on scanning probe microscope images using curvature detectors

2021 ◽  
pp. 21-26
Author(s):  
Pavel V. Gulyaev
Keyword(s):  
Automatic Measurement ◽  
Surface Curvature ◽  
Scanning Probe ◽  
Test Image ◽  
Halftone Image ◽  
Geometric Figures ◽  
Curvature Analysis ◽  
Measurement Tools ◽  
Probe Microscope

The article is devoted to the automatic measurement of objects longitudinal dimensions on images obtained by probe microscopy. The solution of this problem can be relevant for quality control of microelectronics, nanotechnics products and materials. Existing tools for objects length measuring are compared by means of test image containing geometric figures with known dimensions. The advantages of software surface curvature detectors, intended for objects lengths measuring directly on a halftone image by forming the skeleton of an object with a surface curvature detector, are shown. A two-dimensional “Circle” detector, based on the curvature analysis of raster images line and column profilograms, was used for the measuring. The curvature was estimated based on the area of the figure bounded by the profilogram at a predefined interval. Features of measuring the length of objects using curvature maxima are considered. It is shown that the curvature detector allows to more accurately determine the lengths of objects with overlapping contours and a significant brightness range. Algorithms of the detector operation, formation of the object skeleton and determination of its length are described. The results of investigation confirming the performance of the presented algorithms are presented. Comparative analysis with existing length measurement tools, performed on magnetic disk domains and nanopolymer fibers images, showed a more correct detector operation in sceletonization of object and measuring its length.

Scanning-probe microscope analysis of optical thin films: A new analytical tool in a manufacturing environment

1994 ◽  
Vol 52 ◽  
pp. 1068-1069
Author(s):  
S. P. Sapers ◽  
R. Clark ◽  
P. Somerville
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Thermal Control ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
List Type ◽  
Manufacturing Environment ◽  
Physical Measurements ◽  
Probe Microscope

OCLI is a leading manufacturer of thin films for optical and thermal control applications. The determination of thin film and substrate topography can be a powerful way to obtain information for deposition process design and control, and about the final thin film device properties. At OCLI we use a scanning probe microscope (SPM) in the analytical lab to obtain qualitative and quantitative data about thin film and substrate surfaces for applications in production and research and development. This manufacturing environment requires a rapid response, and a large degree of flexibility, which poses special challenges for this emerging technology. The types of information the SPM provides can be broken into three categories:(1)Imaging of surface topography for visualization purposes, especially for samples that are not SEM compatible due to size or material constraints;(2)Examination of sample surface features to make physical measurements such as surface roughness, lateral feature spacing, grain size, and surface area;(3)Determination of physical properties such as surface compliance, i.e. “hardness”, surface frictional forces, surface electrical properties.

scholarly journals Detection of Acetonitrile and Chloroform Using Structures on the Base of Porous Silicon

2019 ◽  
pp. 89
Author(s):  
S.M. Manakov ◽  
M.K. Ibraimov ◽  
Ye. Sagidolda ◽  
Sh.A. Zhumatova ◽  
M.B. Darmenkulova
Keyword(s):  
Porous Silicon ◽  
Organic Compounds ◽  
Electrochemical Etching ◽  
Scanning Probe ◽  
Sensitive Material ◽  
Nanoporous Silicon ◽  
Planar Structures ◽  
Probe Microscope ◽  
Adsorption Phenomena

In this work porous silicon samples obtained by electrochemical etching were investigated. Using scanning probe microscope the morphology of porous silicon samples was studied. To determine the thickness of the porous layer and the pore diameter, micrographs were obtained using a scanning electron microscope. The dimensions of the nanocrystallites were determined from the Raman spectra. For the detection of vapors of organic compounds, planar structures were used. The results of the study confirmed the possibility of using nanoporous silicon as a sensitive material for the determination of acetonitrile and chloroform vapors. It is shown that the adsorption phenomena in porous silicon depend on its structure and morphology. It is established that the humidity of the air when detecting the vapors of organic compounds under investigation has a significant effect on the sensitivity. It is also shown that such structures can be used as instruments for measuring air humidity.

Scanning probe metrology

1992 ◽  
Vol 50 (2) ◽  
pp. 1124-1125
Author(s):  
Joseph E. Griffith
Keyword(s):  
High Vacuum ◽  
Three Dimensions ◽  
Scanning Probe ◽  
Dimensional Metrology ◽  
Position Measurement ◽  
Lattice Constants ◽  
Measurement Tools ◽  
Tube Position ◽  
Probe Microscope ◽  
Electron Microscopes

Scanning probe microscopes have unusual advantages as measurement tools. They achieve high resolution simultaneously in all three dimensions, over almost any solid, in ambients ranging from high vacuum to fluid electrolytes. They offer the prospect of performing dimensional metrology at the atomic level with the calibration linked directly to crystal lattice constants. Application of these microscopes to measurement is not completely straightforward, however. As with optical and electron microscopes, accurate measurement is not possible without a thorough understanding of the instrument's properties. We discuss here two aspects of probe microscope behavior that affect position measurement because they exhibit strong nonlinearities.The piezo ceramic actuators commonly used to generate the probe motion are ferroelectric so they suffer from hysteresis and creep. Consequently, the probe motion must be independently monitored. We have adopted a capacitive scheme for monitoring the probe position in all three dimensions. This scheme allows the tube position to be measured to within 10 nm, though there are distortions caused by the tube bending that must be corrected.

Automation of selected brazes' dynamic properties in high-temperatures' measurement process

2013 ◽  
Vol 18 (2-3) ◽  
pp. 33-41
Author(s):  
Dominik Sankowski ◽  
Marcin Bakala ◽  
Rafał Wojciechowski
Keyword(s):  
Surface Tension ◽  
High Temperatures ◽  
Dynamic Properties ◽  
Automatic Measurement ◽  
Measurement Methodology ◽  
Joining Process ◽  
Wetting Force ◽  
Research Grant

Abstract The good quality of several manufactured components frequently depends on solidliquid interactions existing during processing. Nowadays, the research in material engineering focuses also on modern, automatic measurement methods of joining process properties, i.a. wetting force and surface tension, which allows for quantitative determination of above mentioned parameters. In the paper, the brazes’ dynamic properties in high-temperatures’ measurement methodology and the stand for automatic determination of braze’s properties, constructed and implmented within the research grant nr KBN N N519 441 839 - An integrated platform for automatic measurement of wettability and surface tension of solders at high temperatures, are widely described

A Study of the Photoelectric Effect Caused by a Laser Beam Used in a Beam Bounce Technique in a C-AFM System

2008 ◽  
Author(s):  
Hung-Sung Lin ◽  
Mong-Sheng Wu
Keyword(s):  
Laser Beam ◽  
Failure Analysis ◽  
Atomic Force Microscope ◽  
Photoelectric Effect ◽  
Scanning Probe ◽  
Nanometer Scale ◽  
Electrical Characteristics ◽  
Atomic Force ◽  
Probe Microscope ◽  
Probe Head

Abstract The use of a scanning probe microscope (SPM), such as a conductive atomic force microscope (C-AFM) has been widely reported as a method of failure analysis in nanometer scale science and technology [1-6]. A beam bounce technique is usually used to enable the probe head to measure extremely small movements of the cantilever as it is moved across the surface of the sample. However, the laser beam used for a beam bounce also gives rise to the photoelectric effect while we are measuring the electrical characteristics of a device, such as a pn junction. In this paper, the photocurrent for a device caused by photon illumination was quantitatively evaluated. In addition, this paper also presents an example of an application of the C-AFM as a tool for the failure analysis of trap defects by taking advantage of the photoelectric effect.

Быстродействующая атомно-силовая и сканирующая капиллярная микроскопия в решении задач материаловедения, биологии и медицины

2020 ◽  
Vol 13 (3-4) ◽  
pp. 222-228
Author(s):  
И.В. Яминский ◽  
А.И. Ахметова
Keyword(s):  
Antibiotic Resistance ◽  
Early Detection ◽  
Biomedical Research ◽  
Drug Screening ◽  
Targeted Delivery ◽  
High Speed ◽  
Scanning Probe ◽  
Biological Processes ◽  
Atomic Force ◽  
Probe Microscope

Разработка высокоэффективных режимов быстродействующего сканирующего зондового микроскопа, в первую очередь атомно-силовой и сканирующей капиллярной микроскопии, представляет особый интерес для успешного проведения биомедицинских исследований: изучения биологических процессов и морфологии биополимеров, определения антибио­тикорезистентности бактерий, адресной доставки биомакромолекул, скринингу лекарств, раннему обнаружению биологических агентов (вирусов и бактерий) и др. The development of highly efficient modes of a high-speed scanning probe microscope, primarily atomic force and scanning capillary microscopy, is of particular interest for successful biomedical research: studying biological processes and the morphology of biopolymers, determining antibiotic resistance of bacteria, targeted delivery of biomacromolecules, drug screening, early detection agents (viruses and bacteria), etc.

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