scholarly journals Characterizing the Brain Structural Adaptations Across the Motherhood Transition

2021 ◽  
Vol 2 ◽  
Author(s):  
Magdalena Martínez-García ◽  
María Paternina-Die ◽  
Manuel Desco ◽  
Oscar Vilarroya ◽  
Susanna Carmona
Keyword(s):  
Early Years ◽  
Cross Sectional ◽  
Confounding Variables ◽  
Physiological Adaptations ◽  
Current Article ◽  
Brain Changes ◽  
Magnetic Resonance Imaging Mri ◽  
First Time ◽  
Structural Adaptations

Women that become mothers face notable physiological adaptations during this life-period. Neuroimaging studies of the last decade have provided grounded evidence that women's brains structurally change across the transition into motherhood. The characterization of this brain remodeling is currently in its early years of research. The current article reviews this scientific field by focusing on our longitudinal (pre-to-post pregnancy) Magnetic Resonance Imaging (MRI) studies in first-time parents and other longitudinal and cross-sectional studies of parents. We present the questions that are currently being answered by the parental brain literature and point out those that have not yet been explored. We also highlight potential confounding variables that need to be considered when analyzing and interpreting brain changes observed during motherhood.

Progressive brain changes in schizophrenia: a 1-year follow-up study of diffusion tensor imaging

2009 ◽  
Vol 21 (6) ◽  
pp. 301-307 ◽  
Author(s):  
Miho Ota ◽  
Satoko Obu ◽  
Noriko Sato ◽  
Katsuyoshi Mizukami ◽  
Takashi Asada
Keyword(s):  
Diffusion Tensor Imaging ◽  
Diffusion Tensor ◽  
Three Dimensional ◽  
Anterior Cingulate ◽  
Volume Data ◽  
Cross Sectional ◽  
Schizophrenic Patients ◽  
Brain Changes ◽  
Magnetic Resonance Imaging Mri

Objective:Recent cross-sectional studies suggest that brain changes in schizophrenia are progressive during the course of the disorder. However, it remains unknown whether this is a global process or whether some brain areas are affected to a greater degree. The aim of this study was to examine the longitudinal brain changes in patients with chronic older schizophrenia by magnetic resonance imaging (MRI).Methods:Three-dimensional (3D) T1-weighted and diffusion tensor (DT) MRI were performed twice on each of 16 chronic older schizophrenia patients (mean age = 58.1 ± 6.7 years ) with an interval of 1 year between imaging sessions. To clarify the longitudinal morphological and white matter changes, volume data and normalised diffusion tensor imaging (DTI) metrics were compared between the first and follow-up studies using a paired t-test.Results:Focal cortical volume loss was observed in the left prefrontal lobe and anterior cingulate on volumetric study. In addition, DTI metrics changed significantly at the bilateral posterior superior temporal lobes, left insula, genu of the corpus callosum and anterior cingulate.Conclusion:There are ongoing changes in the brains of schizophrenic patients during the course of the illness. Discrepancies between volume data and DTI metrics may indicate that the pattern of progressive brain changes varies according to brain region.

scholarly journals Influence of the Base Element on the Thermal Properties of Non- Ferrous Chromium-Rich TaC-Containing Alloys Elaborated by Conventional Casting: Part 3: Surface and Cross-Sectional Metallographic Characterization of the Oxidized Alloys

2019 ◽  
Vol 6 ◽  
Author(s):  
Jean-Paul K. Gomis ◽  
Patrice Berthod ◽  
Erwann Etienne
Keyword(s):  
Thermal Properties ◽  
Isothermal Oxidation ◽  
Population Characteristics ◽  
Cross Sectional ◽  
Base Element ◽  
Free Zone ◽  
The Matrix ◽  
Oxide Spallation ◽  
First Time

The six alloys the thermal properties of which and the tendency to oxide spallation of which were studied in the first two parts of this work, were here characterized after oxidation for 70 hours at 1250°C. The external chromia scale, and also the CrTaO4 subsurface oxide, formed for all the alloys, almost independently of the Co and Ni proportions in the base element content. But, because of the formation of more CrTaO4 for the nickel-richest alloys probably due to the higher availability of Ta in the matrix and its easier diffusion towards the neighbourhood of the oxidation front, the adherence of chromia was weakened and spallation, suggested by the thermogravimetric curves in the second part of this work, is here really observed and the denuded part of alloys clearly seen. The degradation of the subsurface, which can be in a first time summarized by the development of a carbide-free zone and a {Cr, Ta}-depleted zone, depends on the Co and Ni proportions. The microstructure of the bulk is differently affected by long exposure at elevated temperature. The changes in carbide population characteristics are stronger for the nickel-based alloys than for the cobalt-based ones. Finally, the isothermal oxidation behaviour is best for the nickel-richest alloys but the oxide spallation behaviour and the potential mechanical properties are the best for the cobalt-richest alloys.

scholarly journals Multi-Steps Registration Protocol for Multimodal MR Images of Hip Skeletal Muscles in a Longitudinal Study

2020 ◽  
Vol 10 (21) ◽  
pp. 7823
Author(s):  
Lucia Fontana ◽  
Alfonso Mastropietro ◽  
Elisa Scalco ◽  
Denis Peruzzo ◽  
Elena Beretta ◽  
...  
Keyword(s):  
Longitudinal Study ◽  
Image Registration ◽  
Mr Images ◽  
Learning Rates ◽  
Speed Up ◽  
Muscle Magnetic Resonance Imaging ◽  
Magnetic Resonance Imaging Mri ◽  
First Time ◽  
Tesla Scanner

Image registration is crucial in multimodal longitudinal skeletal muscle Magnetic Resonance Imaging (MRI) studies to extract reliable parameters that can be used as indicators for physio/pathological characterization of muscle tissue and for assessing the effectiveness of treatments. This paper aims at proposing a reliable registration protocol and evaluating its accuracy in a longitudinal study. The hips of 6 subjects were scanned, in a multimodal protocol, at 2 different time points by a 3 Tesla scanner; the proposed multi-step registration pipeline is based on rigid and elastic transformations implemented in SimpleITK using a multi-resolution technique. The effects of different image pre-processing (muscle masks, isotropic voxels) and different parameters’ values (learning rates and mesh sizes) were quantitatively assessed using standard accuracy indexes. Rigid registration alone does not provide satisfactory accuracy for inter-sessions alignment and a further elastic step is needed. The use of isotropic voxels, combined with the muscle masking, provides the best result in terms of accuracy. Learning rates can be increased to speed up the process without affecting the final results. The protocol described in this paper, complemented by open-source software, can be a useful guide for researchers that approach for the first time the issues related to the muscle MR image registration.

scholarly journals Serum Antioxidant Levels Associated with Subcortical Ischemic Vascular Disease

2014 ◽  
Vol 41 (3) ◽  
pp. 375-381 ◽  
Author(s):  
Xia Zhou ◽  
Long Wang ◽  
Han Liu ◽  
Chao Zhang ◽  
Minmin Zhu ◽  
...  
Keyword(s):  
Vascular Disease ◽  
Serum Bilirubin ◽  
Multivariate Regression Analysis ◽  
Cross Sectional Study ◽  
Cross Sectional ◽  
Confounding Variables ◽  
Overnight Fasting ◽  
Males And Females ◽  
Magnetic Resonance Imaging Mri ◽  
Altered Serum

Objective:We aimed to examine changes in serum bilirubin and uric acid (UA) levels in subcortical ischemic vascular disease (SIVD). In addition, we investigated if altered serum bilirubin and UA levels correlate with the subtypes of SIVD as well as the severity of leukoaraiosis (LA).Methods:This cross-sectional study included 1098 consecutive patients with slight symptoms, such as dizziness, vertigo etc. According to magnetic resonance imaging (MRI) appearances, they were divided into either SIVD group or controls (CN), and the SIVD group was further grouped in lacunar infarction (LI) and LA subtypes, as well as different grades. Serum bilirubin and UA levels were determined by the vanadate oxidase method and enzymatic method respectively, after at least an eight hour overnight fasting, in all subjects.Results:The bilirubin level was obviously lower while the UA level was significantly higher in the SIVD group when compared with the controls. Moreover, the LA subgroup presented more significant changes in bilirubin and UA when compared to the LI subgroup in both males and females. The correlation was positive between the UA levels and the LA severity (r=0.134, p=0.006). Multivariate regression analysis revealed that the odds ratio (95% CI) for SIVD in the lowest tertile of total bilirubin (Tbil<9.58μmol/L) and highest tertile of UA (UA>339μmol/L) were 2.702(1.936–3.770) and 2.135(1.521–2.996) respectively after adjusting for confounding variables.Conclusions:Serum bilirubin levels were lower, whereas UA levels were higher in SIVD patients when compared with controls in both males and females, especially in LA patients. Moreover, serum UA levels positively correlated to LA severity.

Microstructural characterization of CoPtCr/Cr thin film disks by cross-section TEM and elongated probe micro-diffraction

1991 ◽  
Vol 49 ◽  
pp. 762-763
Author(s):  
M.A. Parker ◽  
K.E. Johnson ◽  
C. Hwang ◽  
A. Bermea
Keyword(s):  
Magnetic Recording ◽  
Electron Probe ◽  
Microstructural Characterization ◽  
Crystallographic Structure ◽  
Recording Media ◽  
Layer By Layer ◽  
Cross Sectional ◽  
New Techniques ◽  
Polished Side

We have reported the dependence of the magnetic and recording properties of CoPtCr recording media on the thickness of the Cr underlayer. It was inferred from XRD data that grain-to-grain epitaxy of the Cr with the CoPtCr was responsible for the interaction observed between these layers. However, no cross-sectional TEM (XTEM) work was performed to confirm this inference. In this paper, we report the application of new techniques for preparing XTEM specimens from actual magnetic recording disks, and for layer-by-layer micro-diffraction with an electron probe elongated parallel to the surface of the deposited structure which elucidate the effect of the crystallographic structure of the Cr on that of the CoPtCr.XTEM specimens were prepared from magnetic recording disks by modifying a technique used to prepare semiconductor specimens. After 3mm disks were prepared per the standard XTEM procedure, these disks were then lapped using a tripod polishing device. A grid with a single 1mmx2mm hole was then glued with M-bond 610 to the polished side of the disk.

TEM characterization of silicon epitaxial layer grown on Si-TaS2, eutectic composites

1991 ◽  
Vol 49 ◽  
pp. 802-803
Author(s):  
C.M. Sung ◽  
M. Levinson ◽  
M. Tabasky ◽  
K. Ostreicher ◽  
B.M. Ditchek
Keyword(s):  
Substrate Surface ◽  
Bulk Sample ◽  
Surface Cleaning ◽  
Native Oxide ◽  
Czochralski Growth ◽  
Ion Milling ◽  
Cross Sectional ◽  
Cleaning Methods ◽  
Field Emission Cathodes

Directionally solidified Si/TaSi2 eutectic composites for the development of electronic devices (e.g. photodiodes and field-emission cathodes) were made using a Czochralski growth technique. High quality epitaxial growth of silicon on the eutectic composite substrates requires a clean silicon substrate surface prior to the growth process. Hence a preepitaxial surface cleaning step is highly desirable. The purpose of this paper is to investigate the effect of surface cleaning methods on the epilayer/substrate interface and the characterization of silicon epilayers grown on Si/TaSi2 substrates by TEM.Wafers were cut normal to the <111> growth axis of the silicon matrix from an approximately 1 cm diameter Si/TaSi2 composite boule. Four pre-treatments were employed to remove native oxide and other contaminants: 1) No treatment, 2) HF only; 3) HC1 only; and 4) both HF and HCl. The cross-sectional specimens for TEM study were prepared by cutting the bulk sample into sheets perpendicular to the TaSi2 fiber axes. The material was then prepared in the usual manner to produce samples having a thickness of 10μm. The final step was ion milling in Ar+ until breakthrough occurred. The TEM samples were then analyzed at 120 keV using the Philips EM400T.

Characterization of Rh/Si multilayer structure by HREM and HAADF

1992 ◽  
Vol 50 (1) ◽  
pp. 122-123
Author(s):  
Y. Cheng ◽  
J. Liu ◽  
M.B. Stearns ◽  
D.G. Steams
Keyword(s):  
Normal Incidence ◽  
High Resolution Electron Microscopy ◽  
X Rays ◽  
Beam Direction ◽  
Cross Sectional ◽  
Optical Elements ◽  
Resolution Electron ◽  
Point To Point ◽  
Better Than

The Rh/Si multilayer (ML) thin films are promising optical elements for soft x-rays since they have a calculated normal incidence reflectivity of ∼60% at a x-ray wavelength of ∼13 nm. However, a reflectivity of only 28% has been attained to date for ML fabricated by dc magnetron sputtering. In order to determine the cause of this degraded reflectivity the microstructure of this ML was examined on cross-sectional specimens with two high-resolution electron microscopy (HREM and HAADF) techniques.Cross-sectional specimens were made from an as-prepared ML sample and from the same ML annealed at 298 °C for 1 and 100 hours. The specimens were imaged using a JEM-4000EX TEM operating at 400 kV with a point-to-point resolution of better than 0.17 nm. The specimens were viewed along Si [110] projection of the substrate, with the (001) Si surface plane parallel to the beam direction.

Comparison of Ion-Milling Techniques For Cross-Sectional TEM of Semiconductors

1985 ◽  
Vol 43 ◽  
pp. 166-167
Author(s):  
Julia T. Luck ◽  
C. W. Boggs ◽  
S. J. Pennycook
Keyword(s):  
Analytical Techniques ◽  
Sample Surface ◽  
Ion Milling ◽  
Cross Sectional ◽  
Reliable Technique ◽  
Near Surface ◽  
Transmission Electron ◽  
Thin Region ◽  
Transient Thermal

The use of cross-sectional Transmission Electron Microscopy (TEM) has become invaluable for the characterization of the near-surface regions of semiconductors following ion-implantation and/or transient thermal processing. A fast and reliable technique is required which produces a large thin region while preserving the original sample surface. New analytical techniques, particularly the direct imaging of dopant distributions, also require good thickness uniformity. Two methods of ion milling are commonly used, and are compared below. The older method involves milling with a single gun from each side in turn, whereas a newer method uses two guns to mill from both sides simultaneously.

High-resolution transmission electron microscopic study of highly oxygen doped silicon layer

1989 ◽  
Vol 47 ◽  
pp. 692-693
Author(s):  
H. Takaoka ◽  
M. Tomita ◽  
T. Hayashi
Keyword(s):  
High Resolution ◽  
Oxygen Concentration ◽  
Silicon Layer ◽  
Detailed Structure ◽  
Electron Microscopic ◽  
Cross Sectional ◽  
Transmission Electron ◽  
Doped Silicon ◽  
Argon Ion

High resolution transmission electron microscopy (HRTEM) is the effective technique for characterization of detailed structure of semiconductor materials. Oxygen is one of the important impurities in semiconductors. Detailed structure of highly oxygen doped silicon has not clearly investigated yet. This report describes detailed structure of highly oxygen doped silicon observed by HRTEM. Both samples prepared by Molecular beam epitaxy (MBE) and ion implantation were observed to investigate effects of oxygen concentration and doping methods to the crystal structure.The observed oxygen doped samples were prepared by MBE method in oxygen environment on (111) substrates. Oxygen concentration was about 1021 atoms/cm3. Another sample was silicon of (100) orientation implanted with oxygen ions at an energy of 180 keV. Oxygen concentration of this sample was about 1020 atoms/cm3 Cross-sectional specimens of (011) orientation were prepared by argon ion thinning and were observed by TEM at an accelerating voltage of 400 kV.

Psychological Resilience Provides No Independent Protection From Suicidal Risk

Crisis ◽  
2016 ◽  
Vol 37 (2) ◽  
pp. 130-139 ◽  
Author(s):  
Danica W. Y. Liu ◽  
A. Kate Fairweather-Schmidt ◽  
Richard Burns ◽  
Rachel M. Roberts ◽  
Kaarin J. Anstey
Keyword(s):  
Risk Factors ◽  
Well Being ◽  
Current Status ◽  
Psychological Resilience ◽  
Cross Sectional ◽  
Life Project ◽  
Resilience Factors ◽  
First Time

Abstract. Background: Little is known about the role of resilience in the likelihood of suicidal ideation (SI) over time. Aims: We examined the association between resilience and SI in a young-adult cohort over 4 years. Our objectives were to determine whether resilience was associated with SI at follow-up or, conversely, whether SI was associated with lowered resilience at follow-up. Method: Participants were selected from the Personality and Total Health (PATH) Through Life Project from Canberra and Queanbeyan, Australia, aged 28–32 years at the first time point and 32–36 at the second. Multinomial, linear, and binary regression analyses explored the association between resilience and SI over two time points. Models were adjusted for suicidality risk factors. Results: While unadjusted analyses identified associations between resilience and SI, these effects were fully explained by the inclusion of other suicidality risk factors. Conclusion: Despite strong cross-sectional associations, resilience and SI appear to be unrelated in a longitudinal context, once risk/resilience factors are controlled for. As independent indicators of psychological well-being, suicidality and resilience are essential if current status is to be captured. However, the addition of other factors (e.g., support, mastery) makes this association tenuous. Consequently, resilience per se may not be protective of SI.

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