scholarly journals Reliability-Aware Design of Spike-Event Neuromorphic Circuits

2021 ◽  
Author(s):  
Jani Babu Shaik ◽  
Siona Menezes Picardo ◽  
Sonal Singhal ◽  
Nilesh Goel
Keyword(s):  
Large Scale ◽  
Vlsi Circuits ◽  
Performance Parameters ◽  
Carrier Injection ◽  
Neuromorphic Circuits ◽  
Integrate And Fire ◽  
Bias Temperature Instability ◽  
Large Scale Integration ◽  
Silicon Neurons ◽  
Scale Integration

Very Large Scale Integration (VLSI) based neuromorphic circuits also known as Silicon Neurons (SiNs) emulate the electrophysiological behavior of biological neurons. With the advancement in technology, neuromorphic systems also lead to various reliability issues and hence making their study important. Bias Temperature Instability (BTI) and Hot Carrier Injection (HCI) are the two major reliability issues present in VLSI circuits. In this work, we have investigated the combined effect of BTI and HCI on the two types of integrate-and-fire based SiNs namely (a) Axon-Hillock and (b) Simplified Leaky integrate-and-fire circuits using their key performance parameters. Novel reliability-aware AH and SLIF circuits are proposed to mitigate the reliability issues. Proposed reliability-aware designs show negligible deviation in performance parameters after aging. The time-zero process variability analysis is also carried out for proposed reliability-aware SiNs. The power consumption of existing and proposed reliability-aware neuron circuits is analyzed and compared.<br>

scholarly journals Reliability-Aware Design of Spike-Event Neuromorphic Circuits

2021 ◽  
Author(s):  
Jani Babu Shaik ◽  
Siona Menezes Picardo ◽  
Sonal Singhal ◽  
Nilesh Goel
Keyword(s):  
Large Scale ◽  
Vlsi Circuits ◽  
Performance Parameters ◽  
Carrier Injection ◽  
Neuromorphic Circuits ◽  
Integrate And Fire ◽  
Bias Temperature Instability ◽  
Large Scale Integration ◽  
Silicon Neurons ◽  
Scale Integration

Very Large Scale Integration (VLSI) based neuromorphic circuits also known as Silicon Neurons (SiNs) emulate the electrophysiological behavior of biological neurons. With the advancement in technology, neuromorphic systems also lead to various reliability issues and hence making their study important. Bias Temperature Instability (BTI) and Hot Carrier Injection (HCI) are the two major reliability issues present in VLSI circuits. In this work, we have investigated the combined effect of BTI and HCI on the two types of integrate-and-fire based SiNs namely (a) Axon-Hillock and (b) Simplified Leaky integrate-and-fire circuits using their key performance parameters. Novel reliability-aware AH and SLIF circuits are proposed to mitigate the reliability issues. Proposed reliability-aware designs show negligible deviation in performance parameters after aging. The time-zero process variability analysis is also carried out for proposed reliability-aware SiNs. The power consumption of existing and proposed reliability-aware neuron circuits is analyzed and compared.<br>

scholarly journals Scan-Chain-Fault Diagnosis Using Regressions in Cryptographic Chips for Wireless Sensor Networks

Sensors ◽  
2020 ◽  
Vol 20 (17) ◽  
pp. 4771
Author(s):  
Hyunyul Lim ◽  
Minho Cheong ◽  
Sungho Kang
Keyword(s):  
Wireless Sensor Networks ◽  
Sensor Networks ◽  
Large Scale ◽  
Vlsi Circuits ◽  
Wireless Sensor ◽  
Large Scale Integration ◽  
Diagnosis Method ◽  
Diagnosis Accuracy ◽  
Scan Chain ◽  
Scale Integration

Scan structures, which are widely used in cryptographic circuits for wireless sensor networks applications, are essential for testing very-large-scale integration (VLSI) circuits. Faults in cryptographic circuits can be effectively screened out by improving testability and test coverage using a scan structure. Additionally, scan testing contributes to yield improvement by identifying fault locations. However, faults in circuits cannot be tested when a fault occurs in the scan structure. Moreover, various defects occurring early in the manufacturing process are expressed as faults of scan chains. Therefore, scan-chain diagnosis is crucial. However, it is difficult to obtain a sufficiently high diagnosis resolution and accuracy through the conventional scan-chain diagnosis. Therefore, this article proposes a novel scan-chain diagnosis method using regression and fan-in and fan-out filters that require shorter training and diagnosis times than existing scan-chain diagnoses do. The fan-in and fan-out filters, generated using a circuit logic structure, can highlight important features and remove unnecessary features from raw failure vectors, thereby converting the raw failure vectors to fan-in and fan-out vectors without compromising the diagnosis accuracy. Experimental results confirm that the proposed scan-chain-diagnosis method can efficiently provide higher resolutions and accuracies with shorter training and diagnosis times.

scholarly journals Leakage Power Reduction in CMOS VLSI Circuits using Advance Leakage Reduction Method

2021 ◽  
Vol 9 (VI) ◽  
pp. 962-966
Author(s):  
Ayush Tiwari
Keyword(s):  
Large Scale ◽  
Propagation Delay ◽  
Logic Circuits ◽  
Leakage Power ◽  
Vlsi Circuits ◽  
Time Duration ◽  
Leakage Reduction ◽  
Large Scale Integration ◽  
Cmos Vlsi ◽  
Scale Integration

Recently, consumption of power is key problem of logic circuits based on Very Large Scale Integration. More potentiality consumption isn’t considered an appropriate for storage cell life for the use in cell operations and changes parameters such as optimality, efficiency etc, more consumption of power also provides for minimization of cell storage cycle. In present scenario static consumption of power is major troubles in logic circuits based on CMOS. Layout of drainage less circuit is typically complex. Several derived methods for minimization of consumption of potentiality for logic circuits based on CMOS. For this research paper, a technique called Advance Leakage reduction (AL reduction) is proposed to reduce the leakage power in CMOS logic circuits. To draw our structure circuit related to CMOS like Inverter, inverted AND, and NOR etc. we have seen the power and delay for circuits. This paper incorporates, analyzing of several minimization techniques as compared with proposed work to illustrate minimization in ratio of energy and time usage and time duration for propagation. LECTOR, Source biasing, Stack ONOFIC method is observed and analyzed with the proposed method to evaluate the leakage power consumption and propagation delay for logic circuits based on CMOS. Entire work has done in LT Spice Software with 180nm library of CMOS.

Contact Resistance and Methods for its Determination

1982 ◽  
Vol 18 ◽  
Author(s):  
S. Simon Cohen
Keyword(s):  
Integrated Circuits ◽  
Contact Resistance ◽  
Large Scale ◽  
Ohmic Contacts ◽  
Vlsi Circuits ◽  
Single Element ◽  
Large Scale Integration ◽  
Proper Definition ◽  
Definition Of ◽  
Scale Integration

The problem of low resistance ohmic contacts to silicon has been of considerable technological interest. In recent years this problem has received special attention owing to the effect of scaling in very-large-scale integration (VLSI) technology. The field of ohmic contacts to semiconductors comprises two independent parts. First there exists the material science aspect. The choice of a suitable metallization system, the proper semiconductor parameters and the method of the contact formation is not obvious. Then there is the question of the proper definition of the contact resistance and the way it is measured.Several methods for contact resistance determination have been introduced in the past. All seem to have some drawbacks that either limit their usefulness or raise doubts as to their validity in certain situations. We shall discuss the two-, three- and four-terminal resistor methods of measurement. Relevant theoretical considerations will also be included.For conventional integrated circuits with a moderate junction depth of 1–2 μm, aluminum is uniquely suited as a single-element metallization system. However, for VLSI applications it may become obsolete because of several well-defined metallurgical problems. Thus, other metallization systems have to be investigated. We shall briefly discuss some recent data on several other metallization systems. Finally, the problem of size effects on the contact resistance will be discussed. Recent experimental results suggest important clues regarding the development of alternative metallization systems for VLSI circuits and also point to revisions of estimates of achievable design rules.

scholarly journals COMPARISON AND ANALYSIS OF PERFORMANCE PARAMETERS OF BASIC ADDERS WITH SPARSE ADDER

2021 ◽  
Vol 6 (3) ◽  
Author(s):  
K Srivalli ◽  
Medha G H ◽  
Meghna K P ◽  
Mohan Kumar A ◽  
Darshan Halliyavar
Keyword(s):  
Large Scale ◽  
Vital Role ◽  
Performance Parameters ◽  
Look Ahead ◽  
Ripple Carry Adder ◽  
Large Scale Integration ◽  
Parallel Prefix ◽  
Scale Integration ◽  
Prefix Adder ◽  
Analysis Of Performance

Adders play a vital role in the design of a digital system using VLSI (Very Large Scale Integration) technique. Adders are the basic building block of ALU (Arithmetic Logic Unit) which is an important component of a processor. In this paper we are comparing and analyzing the performance parameters of basic adders like Ripple Carry Adder, Carry Select Adder, Carry Look Ahead Adder, Parallel Prefix Adder along with sparse adder. The above mentioned adders are implemented using 90nm technology in Xilinx ISE 14.7 Suite.

Modeling Selective Attention Using a Neuromorphic Analog VLSI Device

2000 ◽  
Vol 12 (12) ◽  
pp. 2857-2880 ◽  
Author(s):  
Giacomo Indiveri
Keyword(s):  
Selective Attention ◽  
Large Scale ◽  
Saliency Map ◽  
Attention Mechanism ◽  
System Level ◽  
Neuromorphic Circuits ◽  
Vlsi Chip ◽  
Large Scale Integration ◽  
Transceiver Module ◽  
Scale Integration

Attentional mechanisms are required to overcome the problem of flooding a limited processing capacity system with information. They are present in biological sensory systems and can be a useful engineering tool for artificial visual systems. In this article we present a hardware model of a selective attention mechanism implemented on a very large-scale integration (VLSI) chip, using analog neuromorphic circuits. The chip exploits a spike-based representation to receive, process, and transmit signals. It can be used as a transceiver module for building multichip neuromorphic vision systems. We describe the circuits that carry out the main processing stages of the selective attention mechanism and provide experimental data for each circuit. We demonstrate the expected behavior of the model at the system level by stimulating the chip with both artificially generated control signals and signals obtained from a saliency map, computed from an image containing several salient features.

VLSI Implementation and Software Co-Simulation of Digital Image Watermarking with Increased Security

2020 ◽  
Vol 10 (4) ◽  
pp. 634-638
Author(s):  
Vardhana M. ◽  
Anil Kumar Bhat
Keyword(s):  
Communication Systems ◽  
High Speed ◽  
Large Scale ◽  
Image Watermarking ◽  
Intensity Level ◽  
Performance Parameters ◽  
Security Measures ◽  
Large Scale Integration ◽  
And Performance ◽  
Scale Integration

Background: Security is one of the fundamental and essential factors, which has to be addressed in the field of communication. Communication refers to the exchange of useful information between two or more nodes. Sometimes it is required to exchange some of the confidential information such as a company’s logo, which needs to be hidden from the third person. The data that is being exchanged between these nodes has to be kept confidential and secured from unintended users. The three fundamental components of security are confidentiality, integrity and authentication. The data that is being exchanged has to be confidential, and only the authorized party should have access to the information that is being exchanged. One of the key methods for securing the data is encryption. Objective: The main objective of this paper was to address the problem of data hiding and security in communication systems. There is a need for having hardware resources for having high speed data security and protection. Methods: In this paper, we implemented image watermarking using LSB technique to hide a secret image, and employed encryption using Advanced Encryption Standard, to enhance the security of the image. An image is a two dimensional signal, with each pixel value representing the intensity level. The secure transmission of the image along the channel is a challenging task, because of the reason that, any individual can access it, if no security measures are taken. Conclusion: An efficient method of digital watermarking has been implemented with increased security and performance parameters are presented. Results: In this paper, hardware realization of image watermarking/encryption and dewatermarking/ decryption is implemented using Very Large Scale Integration. The design is verified by means of co-simulation using MATLAB and Xilinx. The paper also presents the performance parameters of the design, with respect to speed, area and power.

Crystalline Si Films for Integrated Active-Matrix Liquid-Crystal Displays

MRS Bulletin ◽  
1996 ◽  
Vol 21 (3) ◽  
pp. 39-48 ◽  
Author(s):  
James S. Im ◽  
Robert S. Sposili
Keyword(s):  
Liquid Crystal ◽  
Large Scale ◽  
Liquid Crystal Display ◽  
Liquid Crystal Displays ◽  
Vlsi Circuits ◽  
Active Matrix ◽  
Large Scale Integration ◽  
Scale Integration ◽  
Matrix Liquid ◽  
Si Wafer

The fabrication of thin-film-transistor (TFT) devices on a transparent substrate lies at the heart of active-matrix-liquid-crystal-display (AMLCD) technology. This is both good and bad. On one hand it is a difficult task to manufacture millions of intricate semiconductor devices reliably over such large display substrates. On the positive side, AMLCD technology can aspire to become much more than a “display” technology. The idea is as follows: It is possible for one to readily fabricate additional transistors to execute various electronic functions—those that would otherwise be handled by separate large-scale-integration (LSI) and very large-scale-integration (VLSI) circuits—on the periphery of the display. Since this can be done, in principle, with no—or a minimal number of—additional processing steps, substantial cost reduction is possible and significant value can be added to the final product.Doing so and doing it well can ultimately lead to “system-on-glass” products in which the entire electronic circuitry needed for a product is incorporated directly onto a glass substrate. This means that integrated active-matrix liquid-crystal displays (IAMLCDs) have the potential to bypass conventional Si-wafer-based products and may lead TFT technology to compete directly against Si-wafer-based monolithic integrated circuits.

scholarly journals Timing Optimization During the Physical Synthesis of Cell-Based VLSI Circuits

2017 ◽  
Author(s):  
Vinícius Dos Santos Livramento ◽  
José Luís Güntzel
Keyword(s):  
Integrated Circuits ◽  
Large Scale ◽  
Cmos Technology ◽  
Vlsi Circuits ◽  
Consumer Electronics ◽  
Clock Frequency ◽  
Wide Range ◽  
Large Scale Integration ◽  
On Chip ◽  
Scale Integration

The evolution of CMOS technology made possible integrated circuits with billions of transistors assembled into a single silicon chip, giving rise to the jargon Very-Large-Scale Integration (VLSI). VLSI circuits span a wide range class of applications, including Application Specific Circuits and Systems-On-Chip. The latter are responsible for fueling the consumer electronics market, especially in the segment of smartphones and tablets, which are responsible for pushing hardware performance requirements every new generation. The required clock frequency affects the performance of a VLSI circuit and induces timing constraints that must be properly handled by synthesis tools. This thesis focuses on techniques for timing closure of cellbased VLSI circuits, i.e. techniques able to iteratively reduce the number of timing violations until the synthesis of the synchronous digital system reaches the specified target frequency.

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