The Study of Sputtered Silver-Based Low-Emissivity Coating on Glass

2010 ◽  
Vol 150-151 ◽  
pp. 36-39 ◽  
Author(s):  
Bin Cai ◽  
Rong Sheng Xin ◽  
Xiao Lin Jia
Keyword(s):  
Grain Size ◽  
Fourier Transform ◽  
Surface Morphology ◽  
Scanning Probe ◽  
Visible Range ◽  
Multilayer Coatings ◽  
Transmittance Spectra ◽  
Glass Substrates ◽  
Infrared Spectrometer ◽  
Probe Microscope

Two types of low-emissive coatings were deposited onto glass substrates by magnetron sputting method, which were designed as Ag and TiO2/Ni-Cr/Ag/Ni-Cr/TiO2. The transmittance and thickness of the samples were measured by TH1901 spectrophotometer and NKD-8000V ellipsometer. Fourier transform infrared spectrometer (FTIR) was employed to detect the low emissivity properties, it demonstrated that the silver-based multilayer coatings showed an efficient heat isolation due to their low emissivity properties. And they had a good performance in the visible range compared to the single Ag layer according to the transmittance spectra as well. The surface morphology of the samples was investigated by scanning probe microscope (SPM), it was determined that the Ag layer formed a homogeneous grain size when deposited onto the Ni-Cr layers.

Structural and Magnetic Investigation of Cu, Co Substituted NiFe2O4 Thin Films by Scanning Probe Microscopy (AFM, MFM)

2015 ◽  
Vol 830-831 ◽  
pp. 589-591 ◽  
Author(s):  
Hakikat Sharma ◽  
N.S. Negi
Keyword(s):  
Thin Films ◽  
Grain Size ◽  
Microstructural Analysis ◽  
Secondary Phase ◽  
Scanning Probe ◽  
Force Microscopy ◽  
Atomic Force ◽  
Magnetic Investigation ◽  
Probe Microscope ◽  
Xrd Patterns

In the present study we prepared NiFe2O4, Ni0.95Cu0.05Fe2O4and Ni0.94Cu0.05Co0.01Fe2O4thin films by metallo-organic decomposition method (MOD) using spin coating technique. The samples were characterized by XRD. XRD patterns of thin films confirmed the formation of cubic spinel structure without any secondary phase. For microstructural analysis we characterized samples by Scanning Probe Microscope (SPM). From Atomic force microscopy (AFM), we analyzed surface morphology, calculated grain size, roughness and porosity. It has been found that grain size and roughness affected by Cu, Co substitution. After this we carried out magnetic force microscopy (MFM) on the samples. Effect of substitution on magnetic grains was observed from MFM.

EFFECTS OF SPRAY PYROLYSIS DEPOSITION PARAMETERS ON MORPHOLOGICAL, OPTICAL AND STRUCTURAL PROPERTIES OF WO3 NANOSTRUCTURED THIN FILMS

2020 ◽  
Vol 27 (09) ◽  
pp. 1950203
Author(s):  
ALI AKHAVAN MAVARDIANI ◽  
MOHAMMAD BAGHER RAHMANI
Keyword(s):  
Thin Films ◽  
Surface Morphology ◽  
Spray Pyrolysis ◽  
Precursor Solution ◽  
Cost Effective ◽  
Solution Concentration ◽  
Visible Range ◽  
Glass Substrates ◽  
Deposition Parameters ◽  
Vis Spectroscopy

In this experimental research, tungsten trioxide (WO3) thin films were deposited using ammonium tungstate ((NH4)2WO4) by a simple and cost-effective technique of spray pyrolysis on top of glass substrates. The surface morphology, structural and optical properties of prepared samples were studied using field emission scanning electron microscopy (FESEM), X-ray diffraction (XRD) pattern analysis and UV–Vis spectroscopy techniques, respectively. Studied deposition parameters were: substrate temperature (300, 350, 400, 450 and 500∘C), concentration of the precursor solution (0.01, 0.02, 0.04, 0.08, 0.1 and 0.2[Formula: see text]M), volume of the precursor solution (50, 100, 150 and 200[Formula: see text]mL) and the effect of pulsed spraying at different concentrations (0.01, 0.1 and 0.2[Formula: see text]M). FESEM images showed that the surface morphology has formed like nested micro-fibrous rings with a uniform distribution all over the surface. The XRD patterns revealed that increasing the solution concentration to 0.2[Formula: see text]M shows some peaks which can be attributed to WO3 with the hexagonal crystal structure. Transmission spectra of the samples indicate that all of the prepared samples are transparent in the visible range, with the calculated direct bandgap ranging from about 2.93[Formula: see text]eV to 3.96[Formula: see text]eV, depending on the deposition conditions.

Effect of Deposited Angle on Structure and Surface Morphology of Fluorocarbon Films Deposited by Pulsed Plasma Thruster

2012 ◽  
Vol 268-270 ◽  
pp. 111-114
Author(s):  
Rui Zhang ◽  
Jian Jun Wu ◽  
Dai Xian Zhang ◽  
Fan Zhang ◽  
Zhen He
Keyword(s):  
Surface Morphology ◽  
Photoelectron Spectroscopy ◽  
Chemical Components ◽  
Pulsed Plasma ◽  
Fluorocarbon Films ◽  
Glass Substrates ◽  
Pulsed Plasma Thruster ◽  
Plasma Thruster ◽  
Probe Microscope ◽  
Deposited Films

A series of fluorocarbon films were deposited on glass substrates by Pulsed Plasma Thruster. The effects of deposited angle on chemical structure and surface morphology of these films were investigated using X-ray photoelectron spectroscopy (XPS) and scanning probe microscope (SPM). XPS data imply various carbon-related chemical components present on the surface of the deposited films are strongly impacted by the deposited angle. AFM measurements show that the increase in deposited angle can smoothen the surface morphology and decrease the RMS roughness. Changes in density of the neutral particle and flux of ions that reach the surface affect the formation of fluorocarbon clusters in the films and reduce surface roughness.

Influence of Annealing on the Magnetic Properties of Fe50Co50 Films

2008 ◽  
Vol 47-50 ◽  
pp. 1084-1087
Author(s):  
Ya Qin Li ◽  
Ge Xin Guo ◽  
Li Wang ◽  
Xiu Ling Li
Keyword(s):  
Magnetic Properties ◽  
Annealing Time ◽  
Annealing Temperature ◽  
Magnetic Domain ◽  
Domain Size ◽  
Magnetic Films ◽  
Scanning Probe ◽  
Glass Substrates ◽  
Domain Structures ◽  
Probe Microscope

The Fe50Co50 magnetic films were prepared by magnetron sputtering onto glass substrates. The structural and magnetic properties of the films were investigated as a function of annealing temperature and annealing time. It is found that the films have the better crystallization orientation after annealing. The in-plane coercivity Hc reduces with increasing annealing temperature and annealing time. Coercivity reaches the minimum in the sample annealed at 600°C for 2h. Meanwhile, the saturation magnetization Ms increases with increasing annealing temperature as a whole. A scanning probe microscope was used to scan surface morphology and magnetic domain structures. After annealing, the domain size becomes larger and the contrast of domains increases.

scholarly journals METHOD OF OBTAINING THE SPECTRAL CHARACTERISTICS OF THE SCANNING PROBE MICROSCOPE

2021 ◽  
Vol 11 (2) ◽  
pp. 52-55
Author(s):  
Mariia Kataieva ◽  
Vladimir Kvasnikov
Keyword(s):  
Fourier Transform ◽  
Fourier Transforms ◽  
Spectral Characteristics ◽  
Digital Processing ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Discrete Signals ◽  
Destabilizing Factors ◽  
Probe Microscope ◽  
The Fourier Transform

The article discusses methods and algorithms for digital processing and filtering when carrying out nano-measurements using a scanning probe microscope. The paper discusses frequency methods for improving images, in particular, the use of the Fourier transforms with various filtering methods to improve the quality of the resulting image. Stable computational algorithms have been developed for transforming discrete signals based on the Fourier transform. Methods for the interpretation of the numerical results of the discrete Fourier transform in such packages as Matlab, MathCad, Matematica are presented. It is proposed to use a window transform, developed based on the Fourier transform, which makes it possible to single out the informative features of the signal and to reduce the influence of the destabilizing factors that arise when processing signals from a scanning gold microscope in real conditions.

NANOSTRUCTURE AND PROPERTIES OF INDIUM TIN OXIDE (ITO) FILMS PRODUCED BY ELECTRON BEAM EVAPORATION

2006 ◽  
Vol 20 (17) ◽  
pp. 1049-1058 ◽  
Author(s):  
ARTORN POKAIPISIT ◽  
NITINAI UDOMKAN ◽  
PICHET LIMSUWAN
Keyword(s):  
Grain Size ◽  
Electron Beam ◽  
Surface Morphology ◽  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Electron Beam Evaporation ◽  
Visible Range ◽  
Average Crystalline Size ◽  
Average Grain Size ◽  
Ito Films

Nanocrystal indium tin oxide (ITO) thin films were grown by electron beam evaporation (e-beam). The ITO films were fabricated at substrate temperatures ranging from 100 to 400°C in O 2 partial pressure ranging from 0.10 to 100 mTorr. The surface morphology was monitored using atomic force microscopy (AFM). The charge in the surface morphology of ITO films was discussed in terms of grain size and crystallographic orientations. Grain size measurements of the solid dispersed and the AFM study for nanostructure showed that the oxides were in the nano range (20–30 nm). In general, the values of the optical bandgap for the films are consistently blue-shifted as compared with the crystal size. The average crystalline size determined from the shift of the optical gap were found to be in the range 20–30 nm, which is in excellent agreement with the data obtained from AFM. All ITO films average grain size was ~ 20 nm deposited by e-beam evaporation. The average optical transmittance was 90.50% in the visible range (400–700 nm) and the average bandgap was 3.98 eV. ESR spectrum of ITO film showed random oxygen vacancies which arise due to the changing crystal field effects.

Influence of Annealing Temperature on the Properties of Nanostructure ITO Thin Films Prepared by Ion-Assisted Electron Beam Evaporation

2008 ◽  
Vol 55-57 ◽  
pp. 373-376
Author(s):  
Artorn Pokaipisit ◽  
M. Horprathum ◽  
Pichet Limsuwan
Keyword(s):  
Thin Films ◽  
Electron Beam ◽  
Surface Morphology ◽  
Crystallite Size ◽  
Annealing Temperature ◽  
Optical Transmittance ◽  
Electron Beam Evaporation ◽  
Visible Range ◽  
Glass Substrates ◽  
Ito Thin Films

The influence of annealing temperature on the optical and electrical properties, nanostructure and surface morphology of ITO thin films prepared by ion-assisted electron beam evaporation on the glass substrates has been studied. The resistivity and transmittance spectra were measured by a four-point probe method and spectrophotometer, respectively. The nanostructure and surface morphology were examined by X-ray diffractometer and atomic force microscopy. The results show that the ITO thin films with a thickness of 200 nm is amorphous. The crystallite size and optical band gap of ITO thin films increased after annealing in vacuum at different temperatures from 200 to 350 oC. At 350 oC, high quality crystalline thin films with a crystallite size of about 30 nm were obtained. The average optical transmittance was 84% in the visible range (400-700 nm) and the resistivity of 1.34 × 10-4 W-cm was obtained at a temperature of 350 oC.

Scanning-probe microscope analysis of optical thin films: A new analytical tool in a manufacturing environment

1994 ◽  
Vol 52 ◽  
pp. 1068-1069
Author(s):  
S. P. Sapers ◽  
R. Clark ◽  
P. Somerville
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Thermal Control ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
List Type ◽  
Manufacturing Environment ◽  
Physical Measurements ◽  
Probe Microscope

OCLI is a leading manufacturer of thin films for optical and thermal control applications. The determination of thin film and substrate topography can be a powerful way to obtain information for deposition process design and control, and about the final thin film device properties. At OCLI we use a scanning probe microscope (SPM) in the analytical lab to obtain qualitative and quantitative data about thin film and substrate surfaces for applications in production and research and development. This manufacturing environment requires a rapid response, and a large degree of flexibility, which poses special challenges for this emerging technology. The types of information the SPM provides can be broken into three categories:(1)Imaging of surface topography for visualization purposes, especially for samples that are not SEM compatible due to size or material constraints;(2)Examination of sample surface features to make physical measurements such as surface roughness, lateral feature spacing, grain size, and surface area;(3)Determination of physical properties such as surface compliance, i.e. “hardness”, surface frictional forces, surface electrical properties.

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