First Demonstration of High Temperature SiC CMOS Gate Driver in Bridge Leg for Hybrid Power Module Application
Keyword(s):
A high-temperature silicon carbide power module using CMOS gate drive technology and discrete power devices is presented. The power module was aged at 200V and 300 °C for 3,000 hours in a long-term reliability test. After the initial increase, the variation in the rise time of the module is 27% (49.63ns@1,000h compared to 63.1ns@3,000h), whilst the fall time increases by 54.3% (62.92ns@1,000h compared to 97.1ns@3,000h). The unique assembly enables the integrated circuits of CMOS logic with passive circuit elements capable of operation at temperatures of 300°C and beyond.
2013 ◽
Vol 2013
(HITEN)
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pp. 000254-000259
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Keyword(s):
2013 ◽
Vol 2013
(HITEN)
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pp. 000069-000074
2015 ◽
Vol 2015
(HiTEN)
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pp. 1-9
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Keyword(s):
Keyword(s):
2014 ◽
Vol 2014
(HITEC)
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pp. 000372-000377
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2010 ◽
Vol 2010
(HITEC)
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pp. 000297-000304
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Keyword(s):
2014 ◽
Vol 2014
(HITEC)
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pp. 000198-000205
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Keyword(s):
1988 ◽
Vol 46
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pp. 550-551