Design of a scanning probe microscope with advanced sample treatment capabilities: An atomic force microscope combined with a miniaturized inductively coupled plasma source

2007 ◽  
Vol 78 (6) ◽  
pp. 063703 ◽  
Author(s):  
Markus Hund ◽  
Hans Herold
Keyword(s):  
Atomic Force Microscope ◽  
Inductively Coupled Plasma ◽  
Plasma Source ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Sample Treatment ◽  
Inductively Coupled ◽  
Atomic Force ◽  
Probe Microscope

A Study of the Photoelectric Effect Caused by a Laser Beam Used in a Beam Bounce Technique in a C-AFM System

2008 ◽  
Author(s):  
Hung-Sung Lin ◽  
Mong-Sheng Wu
Keyword(s):  
Laser Beam ◽  
Failure Analysis ◽  
Atomic Force Microscope ◽  
Photoelectric Effect ◽  
Scanning Probe ◽  
Nanometer Scale ◽  
Electrical Characteristics ◽  
Atomic Force ◽  
Probe Microscope ◽  
Probe Head

Abstract The use of a scanning probe microscope (SPM), such as a conductive atomic force microscope (C-AFM) has been widely reported as a method of failure analysis in nanometer scale science and technology [1-6]. A beam bounce technique is usually used to enable the probe head to measure extremely small movements of the cantilever as it is moved across the surface of the sample. However, the laser beam used for a beam bounce also gives rise to the photoelectric effect while we are measuring the electrical characteristics of a device, such as a pn junction. In this paper, the photocurrent for a device caused by photon illumination was quantitatively evaluated. In addition, this paper also presents an example of an application of the C-AFM as a tool for the failure analysis of trap defects by taking advantage of the photoelectric effect.

Bacteria and viruses in the objective of probe microscopy

2021 ◽  
Vol 3 ◽  
Author(s):  
I.V. Yaminsky ◽  
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Probe Microscope

The article is devoted to the study of viruses and bacteria using a scanning probe microscope in the atomic force microscopy mode, in particular, to the question, what data can be obtained using this method and how to interpret it.

scholarly journals Dip Pen Nanolithography: A Desktop Nanofabrication Approach Using High-Throughput Flexible Nanopatterning

2009 ◽  
Vol 17 (2) ◽  
pp. 30-33
Author(s):  
Jason Haaheim ◽  
Omkar A. Nafday
Keyword(s):  
Atomic Force Microscope ◽  
Materials Science ◽  
Scanning Probe ◽  
Massively Parallel ◽  
Atomic Force Microscope Cantilever ◽  
Scanning Probe Lithography ◽  
Atomic Force ◽  
Probe Microscope ◽  
Thermally Actuated ◽  
Dip Pen Nanolithography

Dip Pen Nanolithography (DPN) is a scanning probe lithography technique where an atomic force microscope tip is used to transfer molecules to a surface via a solvent meniscus. This technique allows surface patterning on scales of under 100 nanometres. DPN is the nanotechnology analog of the dip pen (also called the quill pen), where the tip of an atomic force microscope cantilever acts as a “pen,” which is coated with a chemical compound or mixture acting as an “ink,” and put in contact with a substrate, the “paper.”DPN enables direct deposition of nanoscale materials onto a substrate in a flexible manner. The vehicle for deposition can include pyramidal scanning probe microscope tips, hollow tips, and even tips on thermally actuated cantilevers. Recent advances have demonstrated massively parallel patterning using two-dimensional arrays of 55,000 tips, depicted below. Applications of this technology currently range through chemistry, materials science, and the life sciences, and include such work as ultra high density biological nanoarrays, additive photomask repair, and brand protection for pharmaceuticals.

Design and Orthogonality Correction of a Planar Scanner for an Atomic Force Microscope

2006 ◽  
Vol 326-328 ◽  
pp. 401-404
Author(s):  
Dong Yeon Lee ◽  
Dae Gab Gweon
Keyword(s):  
Atomic Force Microscope ◽  
Open Loop ◽  
Scanning Probe ◽  
Total System ◽  
Random Errors ◽  
Element Analysis ◽  
Loop Control ◽  
Atomic Force ◽  
Probe Microscope ◽  
Small Feature

This paper shows a method of designing a nano-positioning planar scanner that can be used in a scanning probe microscope. The planar scanner is composed of flexure guides, piezoelectric actuators and feedback sensors. Furthermore, we used a motion amplifying mechanism in the piezoelectric actuator to achieve a large travel range. We theoretically determined the travel range of the total system and verified the range by using a program based on a finite element analysis. The maximum travel range of the planar scanner was greater than 120 μm. A planar scanner of an atomic force microscope can move samples with a few nm resolutions. To get stable AFM images of small feature samples, a closed loop control could not be used due to large random errors of the sensor. The orthogonality of a new planar scanner having a motion guide is measured and corrected by using a simple electronic circuit in the open loop scanning to reduce the scanner artifact.

scholarly journals Crystal Scanner for Nano-Metrology Applications

2005 ◽  
Vol 13 (2) ◽  
pp. 12-17
Author(s):  
Paul West ◽  
Zhiqiang Peng ◽  
Natalia Starostina
Keyword(s):  
Atomic Force Microscope ◽  
Surface Texture ◽  
Force Sensor ◽  
Scanning Probe ◽  
Sensor Technology ◽  
Nanometer Scale ◽  
Particle Sizes ◽  
Atomic Force ◽  
Dimensional Measurements ◽  
Probe Microscope

Traditionally a scanning probe microscope (SPM), such as the atomic force microscope (AFM), affords spectacular images of surfaces at the nanometer scale. With advanced developments in scanner design, probe manufacturing and force sensor technology it is now possible to make quantitative metrological measurements with an SPM. Quantitative metrological measurements that are possible include: a) dimensional measurements of micro/nano fabricated structures, b) surface texture of surfaces having RMS values of only a few angstroms, and c) measurements of the number of grains, and particles on a surface as well as grain and particle sizes, areas, volumes, and distributions.

Atomi c-force microscopy of viruses and bacteria

2021 ◽  
Vol 2 ◽  
pp. 18-21
Author(s):  
Igor Yaminsky ◽  
◽  
Assel Akhmetova ◽  
Keyword(s):  
Image Processing ◽  
Sample Preparation ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Force Microscopy ◽  
Atomic Force ◽  
Force Mode ◽  
Probe Microscope

The article is devoted to the study of viruses and bacteria using a scanning probe microscope in atomic force mode, in particular, to the features of sample preparation, interpretation of the data obtained, and image processing.

Scanning-probe microscope analysis of optical thin films: A new analytical tool in a manufacturing environment

1994 ◽  
Vol 52 ◽  
pp. 1068-1069
Author(s):  
S. P. Sapers ◽  
R. Clark ◽  
P. Somerville
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Thermal Control ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
List Type ◽  
Manufacturing Environment ◽  
Physical Measurements ◽  
Probe Microscope

OCLI is a leading manufacturer of thin films for optical and thermal control applications. The determination of thin film and substrate topography can be a powerful way to obtain information for deposition process design and control, and about the final thin film device properties. At OCLI we use a scanning probe microscope (SPM) in the analytical lab to obtain qualitative and quantitative data about thin film and substrate surfaces for applications in production and research and development. This manufacturing environment requires a rapid response, and a large degree of flexibility, which poses special challenges for this emerging technology. The types of information the SPM provides can be broken into three categories:(1)Imaging of surface topography for visualization purposes, especially for samples that are not SEM compatible due to size or material constraints;(2)Examination of sample surface features to make physical measurements such as surface roughness, lateral feature spacing, grain size, and surface area;(3)Determination of physical properties such as surface compliance, i.e. “hardness”, surface frictional forces, surface electrical properties.

Быстродействующая атомно-силовая и сканирующая капиллярная микроскопия в решении задач материаловедения, биологии и медицины

2020 ◽  
Vol 13 (3-4) ◽  
pp. 222-228
Author(s):  
И.В. Яминский ◽  
А.И. Ахметова
Keyword(s):  
Antibiotic Resistance ◽  
Early Detection ◽  
Biomedical Research ◽  
Drug Screening ◽  
Targeted Delivery ◽  
High Speed ◽  
Scanning Probe ◽  
Biological Processes ◽  
Atomic Force ◽  
Probe Microscope

Разработка высокоэффективных режимов быстродействующего сканирующего зондового микроскопа, в первую очередь атомно-силовой и сканирующей капиллярной микроскопии, представляет особый интерес для успешного проведения биомедицинских исследований: изучения биологических процессов и морфологии биополимеров, определения антибио­тикорезистентности бактерий, адресной доставки биомакромолекул, скринингу лекарств, раннему обнаружению биологических агентов (вирусов и бактерий) и др. The development of highly efficient modes of a high-speed scanning probe microscope, primarily atomic force and scanning capillary microscopy, is of particular interest for successful biomedical research: studying biological processes and the morphology of biopolymers, determining antibiotic resistance of bacteria, targeted delivery of biomacromolecules, drug screening, early detection agents (viruses and bacteria), etc.

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