scholarly journals Estimating the Asphalt Binder Film Thickness Using Scanning Electron Microscope and Energy Dispersive X-Ray Spectroscopy

2021 ◽  
Vol 2021 ◽  
pp. 1-16
Author(s):  
Fazli Karim ◽  
Jawad Hussain ◽  
Imran Hafeez
Keyword(s):  
Image Analysis ◽  
Electron Microscope ◽  
Film Thickness ◽  
Asphalt Binder ◽  
Binder Content ◽  
Asphalt Mixtures ◽  
X Ray ◽  
Asphalt Mastic ◽  
Micro Level ◽  
Scanning Electron

Asphalt binder film thickness has relation to mixing temperature and binder content in hot mix asphalt, which influences mixture’s performance. A significant variation in assessing the asphalt binder film thickness has been observed in the literature. Development of state of the art technology and Superpave specification requires the study of actual asphalt binder film thickness at micro-level. This study estimates asphalt binder film thickness at micro-level and compares results with those obtained through analytical models from the previous studies. The study utilizes different asphalt mixtures at various mixing temperatures and binder contents. The asphalt binder film thickness around the finest particles of 500 nm (0.5 micron) size in asphalt mastic was detected and measured by image analysis (using scanning electron microscope) and elemental analysis (using energy dispersive X-ray spectroscopy) at magnifying power of ×30,000. The analytical estimation revealed that the asphalt binder film thickness for the aforementioned conditions varies from 9 μm to 13 μm, with a fair relationship to binder content and mixing temperature. However, results obtained from image analysis revealed that the asphalt binder film thickness varies from 0.5 μm to 2.4 μm, with no relation to binder content and mixing temperature. The image analysis showed that the asphalt mixtures mostly contain asphalt mortar and asphalt mastic, occurring in irregular shape. It was also found that the asphalt binder film does exist as a separate entity inside the asphalt mastic in the form of a band around the filler particles as non-absorbed binder, which fills the approximate distance of 0.5 to 2.5 microns among filler particles.

scholarly journals Assessing the Asphalt Binder Film Thickness in Recycled Asphalt Mixtures Using Micro-Level Techniques

Materials ◽  
2021 ◽  
Vol 14 (24) ◽  
pp. 7891
Author(s):  
Fazli Karim ◽  
Jawad Hussain
Keyword(s):  
Image Analysis ◽  
Film Thickness ◽  
Asphalt Binder ◽  
Asphalt Mixture ◽  
Asphalt Mixtures ◽  
Analytical Models ◽  
Recycled Asphalt ◽  
Actual Performance ◽  
Asphalt Mastic ◽  
Micro Level

Adequate asphalt binder film thickness (ABFT) delivers skeletal integrity in recycled asphalt mixtures, resulting in long-lasting roadways when exposed to traffic and environment. The inaccurate measurement of ABFT and the consequences of not having adequate film thickness model has substantially introduced discrepancies in predicting actual performance of recycled asphalt mixtures. Expansion of the ultra-modern expertise and SuperPave requirements necessitate the revision of authentic ABFT at micro-level. The current study identifies the weaknesses of the current methods of estimating ABFT and provides results that are reliable and useful, using modern measurement methods. Using scanning electron microscope (SEM) and energy dispersive x-ray spectroscopy (EDS), this study measures the ABFT around the tiniest particle of 0.2 μm magnitude, entrenched in asphalt mastic in recycled asphalt mixtures. The ABFT, obtained through image analysis, is compared with those obtained through available analytical models. The study utilizes different asphalt mixtures, containing varying proportions of recycled asphalt mixture and rejuvenators. The aggregate, virgin, and recycled binders were characterized in terms of physical and rheological properties, respectively. Marshall mix design was carried out for the conventional and recycled mixture, containing 40%, 50%, and 60% recycled materials, rejuvenated with 3%, 6%, 9%, and 12% waste engine oil (WEO) at a mixing temperature of 160 °C, based on viscosity of the virgin and rejuvenated binder. ABFT was assessed through analytical models and image analysis for the aforesaid recycled asphalt mixtures, prepared at optimum binder and rejuvenator content as per protocol outlined in ASTM D1559. The analytical estimation of ABFT, in the aforesaid recycled asphalt mixtures, revealed that the ABFT fluctuates from 6.4 μm to 13.7 microns, with a significant association to recycled asphalt mixture and rejuvenator content. However, the image analysis revealed that the ABFT, in the aforesaid recycled asphalt mixtures, fluctuates from 0.4 μm to 2 microns, without any association to recycled asphalt mixture or rejuvenator content. The image analysis indicated that the recycled asphalt mixtures typically comprise of mortar, happening in uneven shape, and are used to grip large aggregates. The asphalt mastic, a blend of bitumen and mineral filler, was found to be an interlocking agent, used to grasp only fine particles in asphalt mortar. The asphalt binder film was discovered to be a deviating stand-alone entity that only exists around the mineral fillers in the asphalt mastic as a non-absorbed binder, occupying an imprecise space of 0.4 μm to 2 microns, among the filler particles. The current findings will be useful to design asphalt pavements through the aforesaid precise limit of SEM-based ABFT rather than traditionally measured ABFT to predict the actual performance of recycled asphalt mixtures.

Description of Ore Particles from X-Ray Microtomography (XMT) Images, Supported by Scanning Electron Microscope (SEM)-Based Image Analysis

2018 ◽  
Vol 24 (5) ◽  
pp. 461-470 ◽  
Author(s):  
Orkun Furat ◽  
Thomas Leißner ◽  
Ralf Ditscherlein ◽  
Ondřej Šedivý ◽  
Matthias Weber ◽  
...  
Keyword(s):  
Image Analysis ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Three Dimensional ◽  
Mineralogical Composition ◽  
Particle Systems ◽  
3D Image ◽  
Sem Images ◽  
X Ray ◽  
Scanning Electron

AbstractIn this paper, three-dimensional (3D) image data of ore particle systems is investigated. By combining X-ray microtomography with scanning electron microscope (SEM)-based image analysis, additional information about the mineralogical composition from certain planar sections can be gained. For the analysis of tomographic images of particle systems the extraction of single particles is essential. This is performed with a marker-based watershed algorithm and a post-processing step utilizing a neural network to reduce oversegmentation. The results are validated by comparing the 3D particle-wise segmentation empirically with 2D SEM images, which have been obtained with a different imaging process and segmentation algorithm. Finally, a stereological application is shown, in which planar SEM images are embedded into the tomographic 3D image. This allows the estimation of local X-ray attenuation coefficients, which are material-specific quantities, in the entire tomographic image.

Use of Imaging Techniques for Viewing the Internal Structure of Rubberised Asphalt Mixtures

2014 ◽  
Vol 695 ◽  
pp. 8-11 ◽  
Author(s):  
Norhidayah Abdul Hassan ◽  
Gordon Airey ◽  
Ramadhansyah Putra Jaya ◽  
Mohd Zul Hanif Mahmud ◽  
Nordiana Mashros
Keyword(s):  
Computed Tomography ◽  
Electron Microscope ◽  
Internal Structure ◽  
Imaging Techniques ◽  
Asphalt Mixture ◽  
Asphalt Mixtures ◽  
X Ray ◽  
X Ray Computed ◽  
Rubberized Asphalt Mixture ◽  
Scanning Electron

This paper presents the application of different imaging techniques for viewing the internal structure of rubberized asphalt mixture as road materials. Two imaging techniques were used to capture the internal structure images of its compacted samples i.e. X-ray Computed Tomography (non-destructive method) and Scanning Electron Microscope, SEM (destructive method). Since a lot of previous researchers have produced extensive works on the mechanical properties, therefore, this study is an attempt to introduce the microstructure of rubberized asphalt mixtures produced using dry process method. Two types of dry mixed rubberized asphalt mixture were prepared by modifying a Hot Rolled Asphalt Mixture (HRA 60/20) with different crumb rubber sizes. A mixture of conventional HRA 60/20 was also scanned for comparison. The illustrations are aimed to provide the researchers more information regarding their internal structure distribution.Keywords: Imaging techniques, X-ray Computed Tomography, Scanning Electron Microscope, Rubberised Asphalt Mixture

X-ray micro tomography in the scanning electron microscope

1978 ◽  
Vol 36 (1) ◽  
pp. 106-107 ◽  
Author(s):  
W. Brünger
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Target Surface ◽  
The Body ◽  
X Rays ◽  
Cross Sectional ◽  
X Ray ◽  
Micro Tomography ◽  
Scanning Electron

Reconstructive tomography is a new technique in diagnostic radiology for imaging cross-sectional planes of the human body /1/. A collimated beam of X-rays is scanned through a thin slice of the body and the transmitted intensity is recorded by a detector giving a linear shadow graph or projection (see fig. 1). Many of these projections at different angles are used to reconstruct the body-layer, usually with the aid of a computer. The picture element size of present tomographic scanners is approximately 1.1 mm2.Micro tomography can be realized using the very fine X-ray source generated by the focused electron beam of a scanning electron microscope (see fig. 2). The translation of the X-ray source is done by a line scan of the electron beam on a polished target surface /2/. Projections at different angles are produced by rotating the object.During the registration of a single scan the electron beam is deflected in one direction only, while both deflections are operating in the display tube.

PHAX-SCAN: Functional integration of a Scanning Electron Microscope and an energy-dispersive x-ray analyser

1989 ◽  
Vol 47 ◽  
pp. 56-57
Author(s):  
Marc H. Peeters ◽  
Max T. Otten
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
Functional Integration ◽  
Energy Dispersive ◽  
X Rays ◽  
X Ray ◽  
High Speed Analysis ◽  
Scanning Electron

Over the past decades, the combination of energy-dispersive analysis of X-rays and scanning electron microscopy has proved to be a powerful tool for fast and reliable elemental characterization of a large variety of specimens. The technique has evolved rapidly from a purely qualitative characterization method to a reliable quantitative way of analysis. In the last 5 years, an increasing need for automation is observed, whereby energy-dispersive analysers control the beam and stage movement of the scanning electron microscope in order to collect digital X-ray images and perform unattended point analysis over multiple locations.The Philips High-speed Analysis of X-rays system (PHAX-Scan) makes use of the high performance dual-processor structure of the EDAX PV9900 analyser and the databus structure of the Philips series 500 scanning electron microscope to provide a highly automated, user-friendly and extremely fast microanalysis system. The software that runs on the hardware described above was specifically designed to provide the ultimate attainable speed on the system.

PENGGUNAAN TiO2 PARTIKEL NANO HASIL SINTESIS BERBASIS AIR MENGGUNAKAN METODA SOL-GEL PADA BAHAN KAPAS SEBAGAI APLIKASI UNTUK TEKSTIL ANTI UV

Arena Tekstil ◽  
2013 ◽  
Vol 28 (1) ◽  
Author(s):  
Maya Komalasari ◽  
Bambang Sunendar
Keyword(s):  
Fourier Transform ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Sol Gel ◽  
Crosslinking Agent ◽  
X Ray Diffraction ◽  
Nano Tio2 ◽  
X Ray ◽  
Infra Red ◽  
Scanning Electron

Partikel nano TiO2 berbasis air dengan pH basa telah berhasil disintesis dengan menggunakan metode sol-gel dan diimobilisasi pada kain kapas dengan menggunakan kitosan sebagai zat pengikat silang. Sintesis dilakukan  dengan prekursor TiCl4 pada konsentrasi 0,3 M, 0,5 M dan 1 M, dan menggunakan templat kanji dengan proses kalsinasi pada suhu 500˚C selama 2 jam. Partikel nano TiO2 diaplikasikan ke kain kapas dengan metoda pad-dry-cure dan menggunakan kitosan sebagai crosslinking agent. Berdasarkan hasil Scanning Electron Microscope (SEM),diketahui bahwa morfologi partikel TiO2 berbentuk spherical dengan ukuran nano (kurang dari 100 nm). Karakterisasi X-Ray Diffraction (XRD) menunjukkan adanya tiga tipe struktur kristal utama, yaitu (100), (101) dan (102) dengan fasa kristal yang terbentuk adalah anatase dan rutile. Pada karakterisasi menggunakan SEM terhadap serbuk dari TiO2 yang telah diaplikasikan ke permukaan kain kapas, terlihat adanya imobilisasi partikel nano TiO2 melalui ikatan hidrogen silang dengan kitosan pada kain kapas. Hasil analisa tersebut kemudian dikonfirmasi dengan FTIR (Fourier Transform Infra Red) yang hasilnya memperlihatkan puncak serapan pada bilangan gelombang 3495 cm-1, 2546 cm-1, dan 511 cm-1,  yang masing-masing diasumsikan sebagai adanya vibrasi gugus fungsi O-H, N-H dan Ti-O-Ti. Hasil SEM menunjukkan pula bahwa kristal nano yang terbentuk diantaranya adalah fasa rutile , yang berdasarkan literatur terbukti dapatberfungsi sebagai anti UV.

Failure Analysis of Killer Defects and Yield Enhancement of Flat ROM Devices in Wafer Fabrication

2000 ◽  
Author(s):  
Y. N. Hua ◽  
Z. R. Guo ◽  
L. H. An ◽  
Shailesh Redkar
Keyword(s):  
Electron Microscope ◽  
Failure Analysis ◽  
Fault Isolation ◽  
Yield Enhancement ◽  
Wafer Fabrication ◽  
X Ray ◽  
Particle Contamination ◽  
Emission Microscopy ◽  
Microscopy Techniques ◽  
Scanning Electron

Abstract In this paper, some low yield cases in Flat ROM device (0.45 and 0.6 µm) were investigated. To find killer defects and particle contamination, KLA, bitmap and emission microscopy techniques were used in fault isolation. Reactive ion etching (RIE) and chemical delayering, 155 Wright Etch, BN+ Etch and scanning electron microscope (SEM) were used for identification and inspection of defects. In addition, energy-dispersive X-ray microanalysis (EDX) was used to determine the composition of the particle or contamination. During failure analysis, seven kinds of killer defects and three killer particles were found in Flat ROM devices. The possible root causes, mechanisms and elimination solutions of these killer defects/particles were also discussed.

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