The Aim of this paper is to ensure the compliance of the requirements for the durability of long-life space technology with the fact that regulatory documents for microcircuitry do not contain durability indicators. Thus, in accordance with OST V 11 0998-99, the dependability requirements only contain indicators of reliability and storability. On the other hand, along with the requirements for reliability and storability, the dependability specifications for space technology feature requirements for durability in operation that are usually equal to the gamma-percentile life Тl.г = 100 000 h and more if г = 99.9%. Therefore, for such long-life systems one must define durability indicators that are now absent in the technical conditions or other delivery documents. The definition of such indicators by means of durability testing is costly and time-consuming. Thus, an analytical method was proposed, according to which the lower estimate boundary for the gamma-percentile life Тl.г of microcircuitry can be obtained by equalizing the probability of no-failure of the microcircuit over time Тl.г to the probability of non-occurrence of life failures that put the microcircuit into the limit state, upon which its operation shall be terminated. In this case, in order to obtain Тl.г = 99.9% = 100 000 h, a nonredundant microcircuit or another product must have the failure rate of 10-8 1/h. In the case of more complex microcircuits, it does not appear to be possible to obtain the required value of Тl.г=99.9% = 100 000 h. The paper suggests extending the use of the proposed method of durability indicator identification taking into consideration the fact that in the systems under consideration the failure of any one product is not allowed and, in this view, various ways of ensuring equipment redundancy are used. Hot standby is understood as a redundancy with one or several backup modules that operate similarly to the main module. Warm standby is understood as a redundancy with one or several modules that operate at a lower rate that the main module until they start functioning as the main module. The paper considers a number of redundancy architectures of a complex microcircuit that enable the specified high durability indicators. The formula was obtained for calculation of the durability indicator for more general cases, when the microcircuit is part of a module backed-up by another identical module. In this case, if the second module is in warm standby, a high durability indicator can be ensured for the microcircuit. If the second module is in hot standby, the specified durability indicator of the microcircuit is not ensured. The considered method of durability indicator identification can be used for other redundancy architectures of modules in a system.