scholarly journals A Low Power 6T-Auto Awake Mode-SRAM Design for high speed storage application

2019 ◽  
Vol 8 (9) ◽  
pp. 204-208
Keyword(s):  
Low Power ◽  
High Speed ◽  
Random Access ◽  
Digital World ◽  
Noise Margin ◽  
Sram Cell ◽  
Sram Design ◽  
Static Ram ◽  
Power Application ◽  
Reduced Power Consumption

In the digital world, Static Random Access Memory (SRAM) is one of the efficient core component for electronics design, it consumes huge amount of power and die area. In this research, the SRAM design analysis in terms of read margin, write margin and Static Noise Margin (SNM) for low power application is considered. In SRAM memory, both read and write operation affect by noise margin. So, read and write noise margins are considered as the significant challenges in designing SRAM cell. In this research, robust 6T-SRAM cell is designed to decrease the power utilization. The Auto Awake Mode is developed to control the entire 6T-SRAM cell design. The proposed 6T-SRAM- Auto Awake Mode (6T-SRAM-AAM) was implemented to reduce power utilization of understand and write down operation inside the 20 nm FinFET library. The experimental results showed the proposed 6T-SRAM-AAM design reduced power consumption of read & write operation up to 25% to 33.33% compared to existing Static RAM cells design

scholarly journals Proficient Static RAM design using Sleepy Keeper Leakage Control Transistor & PT-Decoder for handheld application

2019 ◽  
pp. 197-203
Keyword(s):  
Low Power ◽  
High Speed ◽  
Random Access ◽  
Leakage Power ◽  
Access Time ◽  
Sense Amplifier ◽  
Power Simulation ◽  
Sram Cell ◽  
Leakage Control ◽  
Static Ram

Due to their large storage capacity and small access time static random access memory (SRAM) has become a vital part in numerous VLSI chips. Low power adequate memory configuration is a standout among the most challenging issues in SRAM design. As the technology node scaling down, leakage power utilization has turned into a noteworthy issue. In this paper a novel power gating technique, namely sleepy keeper leakage control transistor technique (SK-LCT) is proposed for a handheld gadget application. The SRAM architecture has two primary components, specifically SRAM cell and sense amplifier. The proposed SK-LCT technique is applied in both SRAM cell and sense amplifier for a new low power high speed SRAM architecture design. The outline of SRAM architecture utilizing pass transistor decoder (PT-Decoder) gives better outcomes in term of power. Simulation is done using Tanner EDA tool in 180nm technology and the results demonstrate a noteworthy change in leakage power utilization and speed.

Analysis of 6T SRAM Cell in Different Technologies

2017 ◽  
Vol MCSP2017 (01) ◽  
pp. 7-10 ◽  
Author(s):  
Subhashree Rath ◽  
Siba Kumar Panda
Keyword(s):  
Low Power ◽  
Data Storage ◽  
Low Voltage ◽  
Random Access ◽  
Storage Device ◽  
Cmos Process ◽  
Process Technology ◽  
Digital Devices ◽  
Noise Margin ◽  
Sram Cell

Static random access memory (SRAM) is an important component of embedded cache memory of handheld digital devices. SRAM has become major data storage device due to its large storage density and less time to access. Exponential growth of low power digital devices has raised the demand of low voltage low power SRAM. This paper presents design and implementation of 6T SRAM cell in 180 nm, 90 nm and 45 nm standard CMOS process technology. The simulation has been done in Cadence Virtuoso environment. The performance analysis of SRAM cell has been evaluated in terms of delay, power and static noise margin (SNM).

Design and Analysis of SRAM Cell using Negative Bit-Line Write Assist Technique and Separate Read Port for High-Speed Applications

2021 ◽  
pp. 2150270
Author(s):  
Jitendra Kumar Mishra ◽  
Lakshmi Likhitha Mankali ◽  
Kavindra Kandpal ◽  
Prasanna Kumar Misra ◽  
Manish Goswami
Keyword(s):  
Power Dissipation ◽  
High Speed ◽  
Random Access ◽  
Random Access Memory ◽  
Access Memory ◽  
Static Noise Margin ◽  
Semiconductor Memory ◽  
Noise Margin ◽  
Sram Cell ◽  
Static Noise

The present day electronic gadgets have semiconductor memory devices to store data. The static random access memory (SRAM) is a volatile memory, often preferred over dynamic random access memory (DRAM) due to higher speed and lower power dissipation. However, at scaling down of technology node, the leakage current in SRAM often increases and degrades its performance. To address this, the voltage scaling is preferred which subsequently affects the stability and delay of SRAM. This paper therefore presents a negative bit-line (NBL) write assist circuit which is used for enhancing the write ability while a separate (isolated) read buffer circuit is used for improving the read stability. In addition to this, the proposed design uses a tail (stack) transistor to decrease the overall static power dissipation and also to maintain the hold stability. The comparison of the proposed design has been done with state-of-the-art work in terms of write static noise margin (WSNM), write delay, read static noise margin (RSNM) and other parameters. It has been observed that there is an improvement of 48%, 11%, 19% and 32.4% in WSNM while reduction of 33%, 39%, 48% and 22% in write delay as compared to the conventional 6T SRAM cell, NBL, [Formula: see text] collapse and 9T UV SRAM, respectively.

scholarly journals A Novel concept on 8-Transistor Dynamic Feedback Control on Static RAM Cell Array

2018 ◽  
Vol 7 (2.20) ◽  
pp. 109
Author(s):  
S Renukarani ◽  
Bhavana Godavarthi ◽  
SK Bia Roshini ◽  
Mohammad Khadir
Keyword(s):  
Dynamic Control ◽  
Random Access ◽  
Memory Cell ◽  
Dynamic Feedback ◽  
Cell Array ◽  
Static Noise Margin ◽  
Noise Margin ◽  
Sram Cell ◽  
Static Ram ◽  
Static Noise

A novel idea of 8-Transistor (8T) static random access memory cell with enhanced information stability, sub threshold operation may be outlined. Those prescribed novel built single-ended for dynamic control 8 transistors static RAM (SRAM) cell enhances the static noise margin (SNM) to grater low energy supply. The suggested 8T takes less read and write power supply compared to 6T. Those suggested 8T need higher static noise margin than that from 6T. The portable microprocessor chips need ultralow energy consuming circuits on use battery to more drawn out span. The power utilization might be minimized utilizing non-conventional gadget structures, new circuit topologies, and upgrading the architecture. Although, voltage scaling require of the operation completed over sub threshold for low power consumption, and there will be an inconvenience from exponential decrease in execution. However, to sub threshold regime, that data stability of SRAM cell might a chance to be a amazing issue and worsens for those scaling from claming MOSFET ought to sub-nanometer engineering technology.  

A 3.1 GB/s, 8 Kb, ZERO PRECHARGE, PIPELINED, HIGHLY STABLE 2-PORT 8T SRAM DESIGN IN 65 nm

2013 ◽  
Vol 22 (08) ◽  
pp. 1350069 ◽  
Author(s):  
ABHIJIT SIL ◽  
KRISHNA PRASAD BALUSU ◽  
CHANDRA SEKHAR GURRAM ◽  
MAGDY BAYOUMI
Keyword(s):  
High Speed ◽  
Data Transfer ◽  
Supply Voltage ◽  
Access Time ◽  
Pipeline Architecture ◽  
Noise Margin ◽  
Sram Cell ◽  
Sram Design ◽  
Cell Current ◽  
Stability Issues

As the supply voltage is reducing with feature size, SRAM cell design is going through severe stability issues. The issue becomes worse due to increased variability in below sub-100 nm technology. In this paper, we present a highly stable 2-port 8T SRAM cell for high speed application in 65 nm technology. The proposed design provides high stability under simultaneous read/write disturbed access without reducing the I cell . The cell characteristic is extensively examined under random variation. The dynamic read noise margin is improved by 95% over conventional dual port SRAM. The zero-precharge sensing and virtual ground scheme reduce read path leakage current by 95% over conventional high precharge 2-port SRAM cell. The cell current is improved by 52% over conventional design. Finally, an 8 Kb bit-interleaved 2-stage pipelined SRAM architecture is presented using proposed cell. The 2-stage pipeline architecture provides data transfer bandwidth of 3.1 GB/s. Area-efficient 2-stage decoder layout helps to avoid pseudo read problem in unselected cells without sacrificing memory access time.

scholarly journals Stability analysis of Sub-threshold 6T SRAM cell at 45 nm for IoT application

2019 ◽  
Vol 8 (2) ◽  
pp. 2434-2438
Keyword(s):  
Stability Analysis ◽  
Low Power ◽  
Threshold Voltage ◽  
Supply Voltage ◽  
Stability Parameter ◽  
Threshold Region ◽  
Ultra Low Power ◽  
Noise Margin ◽  
Sram Cell ◽  
Power Application

In ultra-Low power application the supply volt- age in the circuit is as minimum as possible to correct perform the operation. Reducing the supply voltage below the threshold Voltage of transistor is known as sub threshold voltage that affects the delay as well as stability parameter of the Circuit. In this paper body biased technique is applied at standard 6T SRAM which improve the static Current Noise Margin(SINM) and Write trip Current by the factor of 4.15 times and 4.7 times respectively from the Conventional (conv) 6T SRAM. SINM defined the read stability whereas WTI are write ability Parameters of the circuit. In the Sub threshold region delay parameter of the circuit increased, but in this paper delay and power of the proposed circuit are going to be degrades 2.34 times and 4.39 times from the conv. 6T SRAM at different Process Corner i.e. the Performance of the device get increased. In this paper conventional (Conv.)6T and Proposed(PP) 6T both have same W/L ratio at supply voltage of 400mv

scholarly journals Design of Low Power Memory Architecture using 10t Sram Array

2019 ◽  
Vol 8 (4) ◽  
pp. 10650-10653
Keyword(s):  
Low Power ◽  
Power Dissipation ◽  
Low Voltage ◽  
Supply Voltage ◽  
Random Access ◽  
Total Power ◽  
Access Time ◽  
Stable Operation ◽  
Sram Cell ◽  
Sram Design

The main aim of electronics is to design low power devices due to the prevalent usage of powered gadget. Ultra low voltage operation of memory cells has become a subject of a lot of interest because of its applications in terribly low energy computing. The stable operation of static random access memory (SRAM) is important for the success of low voltage SRAM and it is achieved by parameter variations of scaled technologies. The power consumption and access time of the SRAM is also a complex parameter due to the unavoidable switching activities of the number of transistors used for different blocks like, SRAM cell, access transistors, pre-charge circuit, sense amplifier and decoders. It has been shown that conventional 6T SRAM fail to achieve low power and delay operation. The proposed 10T SRAM design gives an approach towards the hold power dissipation. The designed circuit has 10 transistors out of that 2 transistors are used as sleep transistor. The sleep transistors are used as switches. Such as header and footer switches and the switches are turned on during active mode of operations and turned off during idle or standby mode of operations. The designed SRAM cell also has conducting pMOS circuit, which can reduces the total power dissipation. The SRAM cell is simulated by using Cadence tool. A supply voltage of 1.8V is used which makes it enough for low power applications. The power obtained as 761.7mW, which reduces 15% of conventional 6T SRAM design. The delay obtained as 125.6ns, which reduces 45% of conventional 6T SRAM.

scholarly journals Estimation of Write Noise Margin for 6t SRAM Cell in CMOS 45nm technology.

2021 ◽  
Vol 23 (05) ◽  
pp. 211-215
Author(s):  
Hima Bindu Katikala ◽  
◽  
G. Ramana Murthy ◽  
P. Raja Rajeswari ◽  
P. Sai Charan ◽  
...  
Keyword(s):  
High Speed ◽  
Random Access ◽  
Cmos Technology ◽  
Propagation Delay ◽  
Noise Margin ◽  
Sram Cell ◽  
Scaling Process ◽  
Memory Architectures ◽  
Margin Analysis ◽  
Static Noise

For high speed application the static random access memory is mostly demandable. Such kind of device should possess additive parameters that can withstand during transistor scaling process. Their exist static noise margin (SNM) which degrades the device performance of memory architectures, majorly observed at write and read operation create write noise margin (WNM) and read noise margin (RNM). In this paper we discuss about the basic design of 6 transistor SRAM (6T SRAM) using 180nm and 45nm CMOS technology in Cadence Virtuoso with write noise margin analysis. The propagation delay, power dissipation, WNM are measured for both the technologies and observed that WNM is relatively low in 45nm.

Low Power Restoration Circuits Reduce Swing Voltages of SRAM Cell With Improved Read and Write Margins

2021 ◽  
Vol 13 (2) ◽  
pp. 16-28
Author(s):  
Vinod Kumar ◽  
Ram Murti Rawat
Keyword(s):  
Comparative Analysis ◽  
Low Power ◽  
Random Access ◽  
Noise Margin ◽  
Sram Cell ◽  
Static Random Access Memories ◽  
Power Restoration ◽  
Node Voltage ◽  
Static Noise ◽  
Better Than

This paper examines the factors that affect the static noise margin (SNM) of static random access memories which focus on optimizing read and write operation of 8T SRAM cell which is better than 6T SRAM cell using swing restoration for dual node voltage. New 8T SRAM technique on the circuit or architecture level is required. In this paper, comparative analysis of 6T and 8T SRAM cells with improved read and write margin is done for 130nm technology with cadence virtuoso schematics tool.

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