Power dissipation and interconnect noise challenges in nanometer CMOS technologies
Keyword(s):
2010 ◽
Vol 121-122
◽
pp. 97-102
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Keyword(s):
2011 ◽
Vol 131
(8)
◽
pp. 1397-1402
Keyword(s):
2010 ◽
Vol E93-C
(12)
◽
pp. 1670-1678
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2014 ◽
Vol 4
(3)
◽
pp. 9-13
2020 ◽
Vol 10
(4)
◽
pp. 534-547
2015 ◽
Vol 24
(07)
◽
pp. 1550094
◽
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